• 4237 Citations
  • 34 h-Index
1988 …2020

Research output per year

If you made any changes in Pure these will be visible here soon.

Fingerprint Dive into the research topics where Donghwan Kim is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 8 Similar Profiles

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output

Conformal perovskite films on 100 cm2 textured silicon surface using two-step vacuum process

Hwang, J. K., Lee, S. W., Lee, W., Bae, S., Cho, K., Kim, S., Lee, S., Hyun, J. Y., Kang, Y., Lee, H. S. & Kim, D., 2020 Jan 1, In : Thin Solid Films. 693, 137694.

Research output: Contribution to journalArticle

  • Effective Additive-Free Acidic-Solution Texturing for Surface-Damage-Free Kerfless Silicon Wafers

    Jung, Y., Bae, S., Lee, H. S., Kang, Y. & Kim, D., 2020 Mar, In : IEEE Journal of Photovoltaics. 10, 2, p. 431-437 7 p., 8970517.

    Research output: Contribution to journalArticle

    Multifunctional Effect of p-Doping, Antireflection, and Encapsulation by Polymeric Acid for High Efficiency and Stable Carbon Nanotube-Based Silicon Solar Cells

    Qian, Y., Jeon, I., Ho, Y. L., Lee, C., Jeong, S., Delacou, C., Seo, S., Anisimov, A., Kaupinnen, E. I., Matsuo, Y., Kang, Y., Lee, H. S., Kim, D., Delaunay, J. J. & Maruyama, S., 2020 Jan 1, In : Advanced Energy Materials. 10, 1, 1902389.

    Research output: Contribution to journalArticle

  • 1 Citation (Scopus)

    Properties of thermally evaporated titanium dioxide as an electron-selective contact for silicon solar cells

    Lee, C., Bae, S., Park, H. J., Choi, D., Song, H., Lee, H., Ohshita, Y., Kim, D., Kang, Y. & Lee, H. S., 2020 Jan 1, In : Energies. 13, 3, 678.

    Research output: Contribution to journalArticle

    Open Access
  • Analysis of degradation in 25-year-old field-aged crystalline silicon solar cells

    Oh, W., Bae, S., Kim, S., Park, N., Chan, S. I., Choi, H., Hwang, H. & Kim, D., 2019 Sep, In : Microelectronics Reliability. 100-101, 113392.

    Research output: Contribution to journalArticle