If you made any changes in Pure these will be visible here soon.

Fingerprint Dive into the research topics where Jun-Geol Baek is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 1 Similar Profiles
Semiconductor materials Engineering & Materials Science
Process control Engineering & Materials Science
Fault detection Engineering & Materials Science
Wavelet transforms Engineering & Materials Science
Inventory control Engineering & Materials Science
Support vector machines Engineering & Materials Science
Control Charts Mathematics
Neural networks Engineering & Materials Science

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 1997 2019

  • 299 Citations
  • 10 h-Index
  • 31 Article
  • 10 Conference contribution
Chemical vapor deposition
Condition monitoring
Semiconductor materials

An improved real-time contrasts control chart using novelty detection and variable importance

Shin, K. S., Lee, I. S. & Baek, J-G., 2019 Jan 5, In : Applied Sciences (Switzerland). 9, 1, 173.

Research output: Contribution to journalArticle

Process monitoring
Statistical process control
Fault detection
Control charts

Oversampling method using outlier detectable generative adversarial network

Oh, J. H., Hong, J. Y. & Baek, J-G., 2019 Nov 1, In : Expert Systems with Applications. 133, p. 1-8 8 p.

Research output: Contribution to journalArticle

Discriminant analysis
Decision trees
Data structures
6 Citations (Scopus)
Bearings (structural)
wavelet analysis
Wavelet transforms