• 274 Citations
  • 9 h-Index
19972019
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Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 17 Similar Profiles
Semiconductor materials Engineering & Materials Science
Process control Engineering & Materials Science
Fault detection Engineering & Materials Science
Wavelet transforms Engineering & Materials Science
Inventory control Engineering & Materials Science
Support vector machines Engineering & Materials Science
Neural networks Engineering & Materials Science
Heuristic algorithms Engineering & Materials Science

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Research Output 1997 2019

  • 274 Citations
  • 9 h-Index
  • 29 Article
  • 10 Conference contribution

An improved real-time contrasts control chart using novelty detection and variable importance

Shin, K. S., Lee, I. S. & Baek, J-G., 2019 Jan 5, In : Applied Sciences (Switzerland). 9, 1, 173.

Research output: Contribution to journalArticle

charts
Process monitoring
Statistical process control
Fault detection
Control charts
Discriminant analysis
Classifiers
Decision trees
Data structures
1 Citations
Bearings (structural)
wavelet analysis
Wavelet transforms
health
Health

Feature-learning-based printed circuit board inspection via speeded-up robust features and random forest

Yuk, E. H., Park, S. H., Park, C. S. & Baek, J-G., 2018 Jun 5, In : Applied Sciences (Switzerland). 8, 6, 932.

Research output: Contribution to journalArticle

printed circuits
circuit boards
Printed circuit boards
learning
inspection

Kernel-density-based particle defect management for semiconductor manufacturing facilities

Park, S. H., Kim, S. & Baek, J-G., 2018 Feb 1, In : Applied Sciences (Switzerland). 8, 2, 224.

Research output: Contribution to journalArticle

manufacturing
Semiconductor materials
Defects
defects
Fabrication