• 283 Citations
  • 10 h-Index
If you made any changes in Pure these will be visible here soon.

Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 18 Similar Profiles
Semiconductor materials Engineering & Materials Science
Process control Engineering & Materials Science
Fault detection Engineering & Materials Science
Wavelet transforms Engineering & Materials Science
Inventory control Engineering & Materials Science
Support vector machines Engineering & Materials Science
Neural networks Engineering & Materials Science
Heuristic algorithms Engineering & Materials Science

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 1997 2019

  • 283 Citations
  • 10 h-Index
  • 29 Article
  • 10 Conference contribution

An improved real-time contrasts control chart using novelty detection and variable importance

Shin, K. S., Lee, I. S. & Baek, J-G., 2019 Jan 5, In : Applied Sciences (Switzerland). 9, 1, 173.

Research output: Contribution to journalArticle

Process monitoring
Statistical process control
Fault detection
Control charts
Discriminant analysis
Decision trees
Data structures
2 Citations (Scopus)
Bearings (structural)
wavelet analysis
Wavelet transforms
2 Citations (Scopus)

Feature-learning-based printed circuit board inspection via speeded-up robust features and random forest

Yuk, E. H., Park, S. H., Park, C. S. & Baek, J-G., 2018 Jun 5, In : Applied Sciences (Switzerland). 8, 6, 932.

Research output: Contribution to journalArticle

printed circuits
circuit boards
Printed circuit boards
1 Citation (Scopus)

Kernel-density-based particle defect management for semiconductor manufacturing facilities

Park, S. H., Kim, S. & Baek, J-G., 2018 Feb 1, In : Applied Sciences (Switzerland). 8, 2, 224.

Research output: Contribution to journalArticle

Semiconductor materials