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Fingerprint Dive into the research topics where Jun-Geol Baek is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 1 Similar Profiles
Semiconductor materials Engineering & Materials Science
Process control Engineering & Materials Science
Fault detection Engineering & Materials Science
Wavelet transforms Engineering & Materials Science
Inventory control Engineering & Materials Science
Support vector machines Engineering & Materials Science
Control Charts Mathematics
Neural networks Engineering & Materials Science

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Research Output 1997 2019

  • 326 Citations
  • 11 h-Index
  • 32 Article
  • 10 Conference contribution
Chemical vapor deposition
Condition monitoring
Semiconductor materials

An improved real-time contrasts control chart using novelty detection and variable importance

Shin, K. S., Lee, I. S. & Baek, J-G., 2019 Jan 5, In : Applied Sciences (Switzerland). 9, 1, 173.

Research output: Contribution to journalArticle

Process monitoring
Statistical process control
Fault detection
Control charts

Oversampling method using outlier detectable generative adversarial network

Oh, J. H., Hong, J. Y. & Baek, J-G., 2019 Nov 1, In : Expert Systems with Applications. 133, p. 1-8 8 p.

Research output: Contribution to journalArticle


Prediction model based multi-profile monitoring for manufacturing process management

Park, S. H., Park, C. S. & Baek, J-G., 2019 Jan 1, In : International Journal of Industrial Engineering : Theory Applications and Practice. 26, 3, p. 394-406 13 p.

Research output: Contribution to journalArticle

Process control
Discriminant analysis
Decision trees
Data structures