• 269 Citations
  • 9 h-Index
19972018
If you made any changes in Pure these will be visible here soon.

Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 12 Similar Profiles
Semiconductor materials Engineering & Materials Science
Process control Engineering & Materials Science
Fault detection Engineering & Materials Science
Wavelet transforms Engineering & Materials Science
Inventory control Engineering & Materials Science
Support vector machines Engineering & Materials Science
Neural networks Engineering & Materials Science
Heuristic algorithms Engineering & Materials Science

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 1997 2018

  • 269 Citations
  • 9 h-Index
  • 27 Article
  • 10 Conference contribution
1 Citations
Bearings (structural)
wavelet analysis
Wavelet transforms
health
Health

Feature-learning-based printed circuit board inspection via speeded-up robust features and random forest

Yuk, E. H., Park, S. H., Park, C. S. & Baek, J-G., 2018 Jun 5, In : Applied Sciences (Switzerland). 8, 6, 932.

Research output: Contribution to journalArticle

printed circuits
circuit boards
Printed circuit boards
learning
inspection

Kernel-density-based particle defect management for semiconductor manufacturing facilities

Park, S. H., Kim, S. & Baek, J-G., 2018 Feb 1, In : Applied Sciences (Switzerland). 8, 2, 224.

Research output: Contribution to journalArticle

manufacturing
Semiconductor materials
Defects
defects
Fabrication
1 Citations

Real-time contrasts control chart using random forests with weighted voting

Jang, S., Park, S. H. & Baek, J-G., 2017 Apr 1, In : Expert Systems with Applications. 71, p. 358-369 12 p.

Research output: Contribution to journalArticle

Process monitoring
Statistics
Discriminant analysis
Fault detection
Support vector machines

Solving the Singularity Problem of Semiconductor Process Signal Using Improved Dynamic Time Warping

Hong, J. Y., Park, S. H. & Baek, J-G., 2017 Mar 29, Proceedings - IEEE 11th International Conference on Semantic Computing, ICSC 2017. Institute of Electrical and Electronics Engineers Inc., p. 266-267 2 p. 7889540

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Semiconductor materials
Time series
Discrete wavelet transforms