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Conference article
2005

Influence of stress on structural and dielectric anomaly of Bi 2(Zn1/3Ta2/3)2O7 thin films

Noh, J. H., Hong, H. B. & Hong, K. S., 2005, In : Materials Research Society Symposium Proceedings. 875, p. 369-375 7 p., O12.15.

Research output: Contribution to journalConference article