• 3536 Citations
  • 30 h-Index
19952020

Research output per year

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Research Output

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Conference article
2018

Determination of Combined Hardening Parameters to Simulate Deformation Behavior of C(T) Specimen under Cyclic Loading

Ryu, H. W., Kim, H. T., Kim, Y-J. & Kim, J. W., 2018 Jan 1, In : Procedia Structural Integrity. 13, p. 1932-1939 8 p.

Research output: Contribution to journalConference article

Open Access
1 Citation (Scopus)
Open Access

Numerical Simulation of Thermal Ageing Effect on Fracture Behavior for CF8A Cast Stainless Steels under Very Low Cyclic Loading Conditions

Youn, G. G., Nam, H. S., Kim, Y-J. & Kim, J. W., 2018 Jan 1, In : Procedia Structural Integrity. 13, p. 1297-1304 8 p.

Research output: Contribution to journalConference article

Open Access
2015

Crack-Tip Stress Field of Cracked Pipe under Combined Tension and Thermal Load

Je, J. H., Lee, H. S., Kim, D. J. & Kim, Y-J., 2015 Jan 1, In : Procedia Engineering. 130, p. 1686-1694 9 p.

Research output: Contribution to journalConference article

2007

Fatigue properties of surface-micromachined Al-3%Ti thin films

Park, J. H., Myung, M. S. & Kim, Y. J., 2007, In : Key Engineering Materials. 353-358, PART 1, p. 299-302 4 p.

Research output: Contribution to journalConference article

1 Citation (Scopus)
2005
1 Citation (Scopus)
2004

An effective method for measuring elastic modulus of large TFT-LCD panels

Kim, Y. J., Koo, J. C., Moon, S. I. & Kim, Y. J., 2004, In : Key Engineering Materials. 270-273, III, p. 1767-1772 6 p.

Research output: Contribution to journalConference article

A robust method for Ramberg-Osgood fit relevant to elastic-plastic J estimates

Huh, N. S., Kim, Y. J., Kim, Y. J., Choi, Y. H. & Yang, J. S., 2004, In : Key Engineering Materials. 261-263, I, p. 195-200 6 p.

Research output: Contribution to journalConference article

Comments on probabilistic fracture mechanics analysis of cracked components

Huh, N. S., Shim, D. J., Kim, Y. J., Lee, K. H. & Kim, Y. J., 2004, In : Key Engineering Materials. 270-273, III, p. 1755-1760 6 p.

Research output: Contribution to journalConference article

Safety evaluation of socket weld integrity in nuclear piping

Choi, Y. H., Choi, S. Y., Kim, Y. J., Kim, Y. J. & Kim, H. J., 2004, In : Key Engineering Materials. 270-273, III, p. 1725-1730 6 p.

Research output: Contribution to journalConference article

7 Citations (Scopus)

Simplified impact analysis based on equivalent static analysis for impact design of TFT-LCD panels

Kim, Y. J., Koo, J. C., Moon, S. I. & Kim, Y. J., 2004, In : Key Engineering Materials. 270-273, I, p. 114-119 6 p.

Research output: Contribution to journalConference article

2 Citations (Scopus)
2003
1 Citation (Scopus)

Elastic-plastic fracture mechanics assessment of test data for circumferential cracked pipes

Huh, N. S., Shim, D. J., Kim, Y. J. & Kim, Y. J., 2003, In : American Society of Mechanical Engineers, Pressure Vessels and Piping Division (Publication) PVP. 461, p. 71-78 8 p.

Research output: Contribution to journalConference article

Reference stress based fracture mechanics analysis for circumferential through-wall cracked pipes: Experimental validation

Kim, Y. J., Huh, N. S. & Kim, Y. J., 2003 Dec, In : Nuclear Engineering and Design. 226, 2, p. 83-96 14 p.

Research output: Contribution to journalConference article

3 Citations (Scopus)
2000

Plastic η factors based on load-CMOD records for SE(B) toughness testing specimens

Kim, Y. J., 2000, In : Key Engineering Materials. 183, p. I/-

Research output: Contribution to journalConference article

3 Citations (Scopus)

Validation of defect assessment method for structures with weldments

Kim, Y. J., 2000, In : Key Engineering Materials. 183, p. II/-

Research output: Contribution to journalConference article

1995

Tests and analyses for fully plastic fracture mechanics of plane strain mode I crack growth

McClintock, F. A., Kim, Y. J. & Parks, D. M., 1995 Dec, In : ASTM Special Technical Publication. 1256, p. 199-222 24 p.

Research output: Contribution to journalConference article

6 Citations (Scopus)