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A 1.6V 1.4Gb/s/pin consumer DRAM with self-dynamic voltage-scaling technique in 44nm CMOS technology
Hyun Woo Lee, Ki Han Kim, Young Kyoung Choi, Ju Hwan Shon, Nak Kyu Park, Kwan Weon Kim, Chulwoo Kim, Young Jung Choi, Byong Tae Chung
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
6
Citations
(Scopus)