A 1.6V 1.4Gb/s/pin consumer DRAM with self-dynamic voltage-scaling technique in 44nm CMOS technology

Hyun Woo Lee, Ki Han Kim, Young Kyoung Choi, Ju Hwan Shon, Nak Kyu Park, Kwan Weon Kim, Chulwoo Kim, Young Jung Choi, Byong Tae Chung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

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Engineering & Materials Science

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