A 25.2mW EEG-NIRS multimodal SoC for accurate anesthesia depth monitoring

Unsoo Ha, Jaehyuk Lee, Jihee Lee, Kwantae Kim, Minseo Kim, Taehwan Roh, Sang Sik Choi, Hoi Jun Yoo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

There has been recent research into continuous monitoring of the quantitative anesthesia (ANES) depth level for safe surgery [1]. However, the current ANES depth monitoring approach, bispectral index (BIS) [3], uses only EEG from the frontal lobe, and it shows critical limitations in the monitoring of ANES depth such as signal distortion due to electrocautery, EMG and dried gel, and false response to the special types of anesthetic drugs [3]. Near-infrared spectroscopy (NIRS) is complementary to EEG [2], and can not only compensate for the distorted depth level, but also assess the effects of various anesthetic drugs. In spite of its importance, a unified ANES monitoring system using EEG/NIRS together has not been reported because NIRS signals have widely different dynamic ranges (10pA to 10nA), and also signal level variations from person to person and environment are not manageable without closed-loop control (CLC).

Original languageEnglish
Title of host publication2017 IEEE International Solid-State Circuits Conference, ISSCC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages450-451
Number of pages2
Volume60
ISBN (Electronic)9781509037575
DOIs
Publication statusPublished - 2017 Mar 2
Event64th IEEE International Solid-State Circuits Conference, ISSCC 2017 - San Francisco, United States
Duration: 2017 Feb 52017 Feb 9

Other

Other64th IEEE International Solid-State Circuits Conference, ISSCC 2017
CountryUnited States
CitySan Francisco
Period17/2/517/2/9

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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    Ha, U., Lee, J., Lee, J., Kim, K., Kim, M., Roh, T., Choi, S. S., & Yoo, H. J. (2017). A 25.2mW EEG-NIRS multimodal SoC for accurate anesthesia depth monitoring. In 2017 IEEE International Solid-State Circuits Conference, ISSCC 2017 (Vol. 60, pp. 450-451). [7870455] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC.2017.7870455