A 4-Gb/s/pin current mode 4-level simultaneous bidirectional I/O with current mismatch calibration

Yong Sin Kim, Sangho Shin, Sung Mo Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

This paper describes a high speed current mode multi-level simultaneous bi-directional I/O which calibrates pin-to-pin current mismatch. Output impedance is controlled by an impedance matching circuit reducing process variation down to ±2.5%. Maximum 20% pin-to-pin current mismatch is reduced to 1.25% by 4-bit digital calibration scheme. Simulation results based on 0.18μm CMOS process show that the proposed design achieves 4-Gb/s/pin data rate with 512ps timing window and 27mV voltage window. I/O circuits consume 12mW/pin at a supply voltage of 1V.

Original languageEnglish
Title of host publicationISCAS 2006
Subtitle of host publication2006 IEEE International Symposium on Circuits and Systems, Proceedings
Pages1007-1010
Number of pages4
Publication statusPublished - 2006
Externally publishedYes
EventISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems - Kos, Greece
Duration: 2006 May 212006 May 24

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Other

OtherISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems
CountryGreece
CityKos
Period06/5/2106/5/24

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Kim, Y. S., Shin, S., & Kang, S. M. (2006). A 4-Gb/s/pin current mode 4-level simultaneous bidirectional I/O with current mismatch calibration. In ISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems, Proceedings (pp. 1007-1010). [1692758] (Proceedings - IEEE International Symposium on Circuits and Systems).