A 80x60 Micro-Bolometer CMOS Thermal Imager Integrated with a Low-Noise 12-Bit DAC

Ki Duk Kim, Seunghyun Park, Byunghun Lee, Hyung Min Lee, Gyu Hyeong Cho

Research output: Contribution to journalArticlepeer-review

Abstract

A low-cost 80x60 micro-bolometer CMOS thermal imager is presented. The imager system integrated with a proposed 12-bit biasing digital-to-analog converter (DAC) has 100 ms start-up time, which is 300x faster than commercial products, while ensuring comparable 100 mK noise-equivalent temperature difference (NETD). The low-noise biasing DAC adopts a current-mode divider- stacking structure and a bit-inversion technique, leading to mismatch-insensitive operation. The 12-bit biasing DAC in a 0.18 m CMOS imager IC has a low noise of 1.89 Vrms and INL/DNL of 0.14/0.09 LSB, respectively.

Original languageEnglish
JournalIEEE Transactions on Industrial Electronics
DOIs
Publication statusAccepted/In press - 2021

Keywords

  • Calibration
  • CMOS thermal imager
  • Computer architecture
  • Digital-to-analog converter (DAC)
  • Integrated circuits
  • Linearity
  • Micro-bolometer
  • Microprocessors
  • NETD
  • Thermal noise
  • Voltage measurement

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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