A 80x60 Microbolometer CMOS Thermal Imager Integrated with a Low-Noise 12-B DAC

Ki Duk Kim; Seunghyun Park; Byunghun Lee; Hyung Min Lee; Gyu Hyeong Cho

doi:10.1109/TIE.2021.3109542

A 80x60 Microbolometer CMOS Thermal Imager Integrated with a Low-Noise 12-B DAC

Ki Duk Kim, Seunghyun Park, Byunghun Lee, Hyung Min Lee, Gyu Hyeong Cho

School of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

A low-cost 80×60 microbolometer CMOS (complementary metal-oxide-semiconductor) thermal imager is presented. The imager system integrated with a proposed 12-b biasing digital-to-analog converter (DAC) has 100 ms start-up time, which is 300× faster than commercial products, while ensuring comparable 100 mK noise-equivalent temperature difference. The low-noise biasing DAC adopts a current-mode divider-stacking structure and a bit-inversion technique, leading to mismatch-insensitive operation. The 12-b biasing DAC in a 0.18 μm CMOS imager IC has a low noise of 1.89 μVrms and INL (integral non-linearity)/DNL (differential non-linearity) of 0.14/0.09 LSB, respectively.

Original language	English
Pages (from-to)	8604-8608
Number of pages	5
Journal	IEEE Transactions on Industrial Electronics
Volume	69
Issue number	8
DOIs	https://doi.org/10.1109/TIE.2021.3109542
Publication status	Published - 2022 Aug 1

Keywords

CMOS thermal imager
digital-to-analog converter (DAC)
microbolometer
noise-equivalent temperature difference (NETD)

ASJC Scopus subject areas

Control and Systems Engineering
Electrical and Electronic Engineering

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10.1109/TIE.2021.3109542

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title = "A 80x60 Microbolometer CMOS Thermal Imager Integrated with a Low-Noise 12-B DAC",

abstract = "A low-cost 80×60 microbolometer CMOS (complementary metal-oxide-semiconductor) thermal imager is presented. The imager system integrated with a proposed 12-b biasing digital-to-analog converter (DAC) has 100 ms start-up time, which is 300× faster than commercial products, while ensuring comparable 100 mK noise-equivalent temperature difference. The low-noise biasing DAC adopts a current-mode divider-stacking structure and a bit-inversion technique, leading to mismatch-insensitive operation. The 12-b biasing DAC in a 0.18 μm CMOS imager IC has a low noise of 1.89 μVrms and INL (integral non-linearity)/DNL (differential non-linearity) of 0.14/0.09 LSB, respectively. ",

keywords = "CMOS thermal imager, digital-to-analog converter (DAC), microbolometer, noise-equivalent temperature difference (NETD)",

author = "Kim, {Ki Duk} and Seunghyun Park and Byunghun Lee and Lee, {Hyung Min} and Cho, {Gyu Hyeong}",

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AU - Park, Seunghyun

AU - Lee, Byunghun

AU - Lee, Hyung Min

AU - Cho, Gyu Hyeong

PY - 2022/8/1

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N2 - A low-cost 80×60 microbolometer CMOS (complementary metal-oxide-semiconductor) thermal imager is presented. The imager system integrated with a proposed 12-b biasing digital-to-analog converter (DAC) has 100 ms start-up time, which is 300× faster than commercial products, while ensuring comparable 100 mK noise-equivalent temperature difference. The low-noise biasing DAC adopts a current-mode divider-stacking structure and a bit-inversion technique, leading to mismatch-insensitive operation. The 12-b biasing DAC in a 0.18 μm CMOS imager IC has a low noise of 1.89 μVrms and INL (integral non-linearity)/DNL (differential non-linearity) of 0.14/0.09 LSB, respectively.

AB - A low-cost 80×60 microbolometer CMOS (complementary metal-oxide-semiconductor) thermal imager is presented. The imager system integrated with a proposed 12-b biasing digital-to-analog converter (DAC) has 100 ms start-up time, which is 300× faster than commercial products, while ensuring comparable 100 mK noise-equivalent temperature difference. The low-noise biasing DAC adopts a current-mode divider-stacking structure and a bit-inversion technique, leading to mismatch-insensitive operation. The 12-b biasing DAC in a 0.18 μm CMOS imager IC has a low noise of 1.89 μVrms and INL (integral non-linearity)/DNL (differential non-linearity) of 0.14/0.09 LSB, respectively.

KW - CMOS thermal imager

KW - digital-to-analog converter (DAC)

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A 80x60 Microbolometer CMOS Thermal Imager Integrated with a Low-Noise 12-B DAC

Abstract

Keywords

ASJC Scopus subject areas

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