Fingerprint
Dive into the research topics of 'A classification and verification of real pattern defects with dust filtering in tape substrate inspection'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
A classification and verification of real pattern defects with dust filtering in tape substrate inspection
Young Jun Roh, Cheol Woo Kim, Jung Yeol Yeom, Chang Ook Jung, Dae Hwa Jeong
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
1
Citation
(Scopus)