Mathematics
Substrate
100%
Inspection
95%
Defects
86%
Filtering
86%
Trivial
41%
Etching
27%
Brightness
25%
Critical Dimension
23%
Optics
22%
Image Analysis
21%
High Resolution
21%
Image Processing
18%
Maximise
16%
Statistic
15%
Classify
13%
Experiment
12%
Series
10%
Operator
8%
Model
5%
Engineering & Materials Science
Dust
87%
Tapes
87%
Inspection
65%
Substrates
60%
Defects
58%
Etching
18%
Optics
17%
Luminance
16%
Image analysis
16%
Fast Fourier transforms
16%
Image processing
13%
Statistics
12%
Networks (circuits)
9%
Experiments
6%
Physics & Astronomy
tapes
84%
inspection
80%
dust
71%
defects
47%
reviewing
21%
fast Fourier transformations
20%
bears
19%
image analysis
18%
image processing
17%
micrometers
15%
brightness
14%
statistics
13%
etching
13%
optics
12%
operators
12%
high resolution
10%
Chemical Compounds
Dust
95%
Etching
77%
Filtration
74%
Dimension
65%
Shape
56%