A clustering algorithm-based control chart for inhomogeneously distributed TFT-LCD processes

Ji Hoon Kang, Seoung Bum Kim

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Statistical process control techniques have been widely used to improve processes by reducing variations and defects. In the present paper, we propose a multivariate control chart technique based on a clustering algorithm that can effectively handle a situation in which the distribution of in-control observations is inhomogeneous. A simulation study was conducted to examine the characteristics of the proposed control chart and to compare them with Hotellings T 2 multivariate control charts that are widely used in real-world processes. Moreover, an experiment with real data from the thin film transistor liquid crystal display (TFT-LCD) manufacturing process demonstrated the effectiveness and accuracy of the proposed control chart.

Original languageEnglish
Pages (from-to)5644-5657
Number of pages14
JournalInternational Journal of Production Research
Volume51
Issue number18
DOIs
Publication statusPublished - 2013 Sep 1

Fingerprint

Thin film transistors
Liquid crystal displays
Clustering algorithms
Statistical process control
Defects
Control charts
Multivariate control charts
Clustering algorithm
Experiments
Hotelling
Experiment
Manufacturing process
Simulation study

Keywords

  • bootstrap
  • clustering algorithm
  • Hotellings T
  • multivariate control chart
  • TFT-LCD

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Management Science and Operations Research
  • Strategy and Management

Cite this

A clustering algorithm-based control chart for inhomogeneously distributed TFT-LCD processes. / Kang, Ji Hoon; Kim, Seoung Bum.

In: International Journal of Production Research, Vol. 51, No. 18, 01.09.2013, p. 5644-5657.

Research output: Contribution to journalArticle

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