A CMOS readout IC design for uncooled infrared bolometer image sensor application

Sang Joon Hwang, Aram Shin, Ho Hyun Shin, Man Young Sung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Abstract

As infrared light is radiated, the CMOS Readout IC (ROIC) for the microbolometer type infrared sensor detects voltage or current when the resistance value in the bolometer sensor varies. One of the serious problems in designing the ROIC is that resistances in the bolometer and replica resistor have process variation. This means that each pixel does not have the same resistance, causing serious fixed pattern noise problems in sensor operations. In this paper, differential input stage readout architecture is suggested for bias offset reduction, noise immunity and high sensing margin. In addition, using this scheme the effects of a process variation problem and various other bias heating noise problems, are reduced. In this paper, a prototype ROICs, intended for uncooled microbolometer infrared focal plane array, is designed and fabricated. The proposed architecture is demonstrated by fabrication of a prototype consisting of 32 × 32 pixels fabricated in a 0.25-μm CMOS process.

Original languageEnglish
Title of host publicationInternational Symposium on Industrial Electronics 2006, ISIE 2006
Pages2788-2791
Number of pages4
DOIs
Publication statusPublished - 2006 Dec 1
EventInternational Symposium on Industrial Electronics 2006, ISIE 2006 - Montreal, QC, Canada
Duration: 2006 Jul 92006 Jul 13

Publication series

NameIEEE International Symposium on Industrial Electronics
Volume4

Other

OtherInternational Symposium on Industrial Electronics 2006, ISIE 2006
CountryCanada
CityMontreal, QC
Period06/7/906/7/13

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering

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    Hwang, S. J., Shin, A., Shin, H. H., & Sung, M. Y. (2006). A CMOS readout IC design for uncooled infrared bolometer image sensor application. In International Symposium on Industrial Electronics 2006, ISIE 2006 (pp. 2788-2791). [4078832] (IEEE International Symposium on Industrial Electronics; Vol. 4). https://doi.org/10.1109/ISIE.2006.296056