A CMOS TDC-based digital magnetic hall sensor using the self temperature compensation

Young J. Min, Soo-Won Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

A CMOS TDC-based digital magnetic Mall sensor using the self temperature compensation schemes is proposed. The proposed sensor consists of the sensor device, its bias and signal-processing circuit which is fully compatible with a standard CMOS technology. For the high magnetic sensitivity, the MAGFET is implemented with proper geometric parameters. The TDC-based digital circuit is proposed for the low power consumption and easy design. The self temperature compensation schemes of mobility and threshold voltage temperature effects are utilized for the low temperature variation. The proposed sensor is implemented with a standard 0.18μm CMOS technology and shows the good detectable resolution by 0.8μT under magnetic fields ranging from 0 to 0.8T and temperature variations by 250nT ranging from -40°C to +80°C. And the very low power consumption by 36μnW at 1.8V supply voltage is measured.

Original languageEnglish
Title of host publicationProceedings of the Custom Integrated Circuits Conference
Pages329-332
Number of pages4
DOIs
Publication statusPublished - 2008
EventIEEE 2008 Custom Integrated Circuits Conference, CICC 2008 - San Jose, CA, United States
Duration: 2008 Sep 212008 Sep 24

Other

OtherIEEE 2008 Custom Integrated Circuits Conference, CICC 2008
CountryUnited States
CitySan Jose, CA
Period08/9/2108/9/24

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Min, Y. J., & Kim, S-W. (2008). A CMOS TDC-based digital magnetic hall sensor using the self temperature compensation. In Proceedings of the Custom Integrated Circuits Conference (pp. 329-332). [4672088] https://doi.org/10.1109/CICC.2008.4672088