A data mining approach to improve phase I process control

Chang W. Kang, Thuntee Sukchotrat, Seoung Bum Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We propose a data mining approach to improve the phase I analysis of statistical process control. We use the clustering analysis to make initial groups of the historical data, followed by the classification analysis, along with the synthetic datasets to further purify the in-control data. The simulation study shows that our proposed approach performs better than a traditional control chart technique.

Original languageEnglish
Title of host publicationIIE Annual Conference and Expo 2007 - Industrial Engineering's Critical Role in a Flat World - Conference Proceedings
Pages192-196
Number of pages5
Publication statusPublished - 2007 Dec 1
Externally publishedYes
EventIIE Annual Conference and Expo 2007 - Industrial Engineering's Critical Role in a Flat World - Nashville, TN, United States
Duration: 2007 May 192007 May 23

Other

OtherIIE Annual Conference and Expo 2007 - Industrial Engineering's Critical Role in a Flat World
CountryUnited States
CityNashville, TN
Period07/5/1907/5/23

Fingerprint

Statistical process control
Process control
Data mining
Control charts

Keywords

  • Classification analysis
  • Clustering analysis
  • Data mining
  • Multivariate control chart
  • Phase I analysis

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering

Cite this

Kang, C. W., Sukchotrat, T., & Kim, S. B. (2007). A data mining approach to improve phase I process control. In IIE Annual Conference and Expo 2007 - Industrial Engineering's Critical Role in a Flat World - Conference Proceedings (pp. 192-196)

A data mining approach to improve phase I process control. / Kang, Chang W.; Sukchotrat, Thuntee; Kim, Seoung Bum.

IIE Annual Conference and Expo 2007 - Industrial Engineering's Critical Role in a Flat World - Conference Proceedings. 2007. p. 192-196.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kang, CW, Sukchotrat, T & Kim, SB 2007, A data mining approach to improve phase I process control. in IIE Annual Conference and Expo 2007 - Industrial Engineering's Critical Role in a Flat World - Conference Proceedings. pp. 192-196, IIE Annual Conference and Expo 2007 - Industrial Engineering's Critical Role in a Flat World, Nashville, TN, United States, 07/5/19.
Kang CW, Sukchotrat T, Kim SB. A data mining approach to improve phase I process control. In IIE Annual Conference and Expo 2007 - Industrial Engineering's Critical Role in a Flat World - Conference Proceedings. 2007. p. 192-196
Kang, Chang W. ; Sukchotrat, Thuntee ; Kim, Seoung Bum. / A data mining approach to improve phase I process control. IIE Annual Conference and Expo 2007 - Industrial Engineering's Critical Role in a Flat World - Conference Proceedings. 2007. pp. 192-196
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