TY - GEN
T1 - A denoised embedding space of genetic perturbation using Deep Metric Learning
AU - Ju, Minjae
AU - Lee, Sanghoon
AU - Kang, Jaewoo
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - Identifying and relieving internal noises of expression profile is crucial in drug discovery. Among various perturbagens, the most common cause of off-target effects in genetic perturbation is known as seed effects. In this paper, we propose a model to denoise seed effects in LINCS/L1000 gene knock down (KD) dataset by using deep metric learning. Results show that our model can embed profiles with the identical gene target into similar embedding spaces, whereas profiles with the same seed sequence but with different gene targets can embed farther away. This robust embedding space could help reveal the mechanism of actions (MoA) of compounds or solve other downstream tasks using expression profiles.
AB - Identifying and relieving internal noises of expression profile is crucial in drug discovery. Among various perturbagens, the most common cause of off-target effects in genetic perturbation is known as seed effects. In this paper, we propose a model to denoise seed effects in LINCS/L1000 gene knock down (KD) dataset by using deep metric learning. Results show that our model can embed profiles with the identical gene target into similar embedding spaces, whereas profiles with the same seed sequence but with different gene targets can embed farther away. This robust embedding space could help reveal the mechanism of actions (MoA) of compounds or solve other downstream tasks using expression profiles.
KW - data denoising
KW - deep metric learning
KW - drug discovery
KW - gene expression profile
UR - http://www.scopus.com/inward/record.url?scp=85127594597&partnerID=8YFLogxK
U2 - 10.1109/BigComp54360.2022.00085
DO - 10.1109/BigComp54360.2022.00085
M3 - Conference contribution
AN - SCOPUS:85127594597
T3 - Proceedings - 2022 IEEE International Conference on Big Data and Smart Computing, BigComp 2022
SP - 378
EP - 381
BT - Proceedings - 2022 IEEE International Conference on Big Data and Smart Computing, BigComp 2022
A2 - Unger, Herwig
A2 - Kim, Young-Kuk
A2 - Hwang, Eenjun
A2 - Cho, Sung-Bae
A2 - Pareigis, Stephan
A2 - Kyandoghere, Kyamakya
A2 - Ha, Young-Guk
A2 - Kim, Jinho
A2 - Morishima, Atsuyuki
A2 - Wagner, Christian
A2 - Kwon, Hyuk-Yoon
A2 - Moon, Yang-Sae
A2 - Leung, Carson
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2022 IEEE International Conference on Big Data and Smart Computing, BigComp 2022
Y2 - 17 January 2022 through 20 January 2022
ER -