A DRAM based physical unclonable function capable of generating >1032 Challenge Response Pairs per 1Kbit array for secure chip authentication

Qianying Tang, Chen Zhou, Woong Choi, Gyuseong Kang, Jongsun Park, Keshab K. Parhi, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

A DRAM based Physical Unclonable Function (PUF) utilizing the location of weak retention cells is demonstrated in 65nm CMOS. A new authentication scheme is proposed for the DRAM PUF where a random pattern is written to a small section of the DRAM and then retention failures are induced. To further increase the number of Challenge Response Pairs (CPRs), the data pattern including retention failures is transferred to a different memory location where additional retention failures are induced. This scheme enables more than 1032 unique CRPs from a 1Kbit array. To improve the stability of the PUF response, a zero-overhead repetitive write-back technique along with bit-masking was utilized. Voltage and temperature induced instabilities were mitigated by adjusting the read reference voltage and refresh time before each authentication operation. The proposed DRAM PUF has a bit cell area of 0.68μm2.

Original languageEnglish
Title of host publication38th Annual Custom Integrated Circuits Conference
Subtitle of host publicationA Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Volume2017-April
ISBN (Electronic)9781509051915
DOIs
Publication statusPublished - 2017 Jul 26
Event38th Annual Custom Integrated Circuits Conference, CICC 2017 - Austin, United States
Duration: 2017 Apr 302017 May 3

Other

Other38th Annual Custom Integrated Circuits Conference, CICC 2017
CountryUnited States
CityAustin
Period17/4/3017/5/3

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Tang, Q., Zhou, C., Choi, W., Kang, G., Park, J., Parhi, K. K., & Kim, C. H. (2017). A DRAM based physical unclonable function capable of generating >1032 Challenge Response Pairs per 1Kbit array for secure chip authentication. In 38th Annual Custom Integrated Circuits Conference: A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017 (Vol. 2017-April). [7993610] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CICC.2017.7993610