A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices

Min Kyu Joo, Pilsoo Kang, Yongha Kim, Gyu-Tae Kim, Sangtae Kim

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT.

Original languageEnglish
Article number034702
JournalReview of Scientific Instruments
Volume82
Issue number3
DOIs
Publication statusPublished - 2011 Mar 1

Fingerprint

Carbon nanotube field effect transistors
Dielectric Spectroscopy
Carbon Nanotubes
Single-walled carbon nanotubes (SWCN)
Electric Impedance
Noise
analyzers
field effect transistors
carbon nanotubes
Spectroscopy
impedance
Equipment and Supplies
Spectroscopic analysis
Carrier transport
preamplifiers
impedance measurement
spectroscopic analysis
Electric potential
electric potential
noise spectra

ASJC Scopus subject areas

  • Instrumentation
  • Medicine(all)

Cite this

A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices. / Joo, Min Kyu; Kang, Pilsoo; Kim, Yongha; Kim, Gyu-Tae; Kim, Sangtae.

In: Review of Scientific Instruments, Vol. 82, No. 3, 034702, 01.03.2011.

Research output: Contribution to journalArticle

Joo, Min Kyu ; Kang, Pilsoo ; Kim, Yongha ; Kim, Gyu-Tae ; Kim, Sangtae. / A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices. In: Review of Scientific Instruments. 2011 ; Vol. 82, No. 3.
@article{902efdb0d1004715a7b9d4a213f8f82d,
title = "A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices",
abstract = "This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT.",
author = "Joo, {Min Kyu} and Pilsoo Kang and Yongha Kim and Gyu-Tae Kim and Sangtae Kim",
year = "2011",
month = "3",
day = "1",
doi = "10.1063/1.3553208",
language = "English",
volume = "82",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "3",

}

TY - JOUR

T1 - A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices

AU - Joo, Min Kyu

AU - Kang, Pilsoo

AU - Kim, Yongha

AU - Kim, Gyu-Tae

AU - Kim, Sangtae

PY - 2011/3/1

Y1 - 2011/3/1

N2 - This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT.

AB - This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT.

UR - http://www.scopus.com/inward/record.url?scp=79953654021&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79953654021&partnerID=8YFLogxK

U2 - 10.1063/1.3553208

DO - 10.1063/1.3553208

M3 - Article

C2 - 21456771

AN - SCOPUS:79953654021

VL - 82

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 3

M1 - 034702

ER -