A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials

Seungwan Cho, Jekwan Lee, Soohyun Park, Hyemin Bae, Minji Noh, Beom Kim, Chihun In, Seung Hoon Yang, Sooun Lee, Seung Young Seo, Jehyun Kim, Chul-Ho Lee, Wooyoung Shim, Moon Ho Jo, Dohun Kim, Hyunyong Choi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a computer algorithm for layer number estimation of few-layered two-dimensional materials. Based on the optical contrast method, this algorithm analyzes an optical microscope image in a few seconds with high accuracy over 90%.

Original languageEnglish
Title of host publication2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781943580422
Publication statusPublished - 2018 Aug 6
Event2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States
Duration: 2018 May 132018 May 18

Other

Other2018 Conference on Lasers and Electro-Optics, CLEO 2018
CountryUnited States
CitySan Jose
Period18/5/1318/5/18

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Cho, S., Lee, J., Park, S., Bae, H., Noh, M., Kim, B., In, C., Yang, S. H., Lee, S., Seo, S. Y., Kim, J., Lee, C-H., Shim, W., Jo, M. H., Kim, D., & Choi, H. (2018). A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials. In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings [8427021] Institute of Electrical and Electronics Engineers Inc..