A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials

Seungwan Cho, Jekwan Lee, Soohyun Park, Hyemin Bae, Minji Noh, Beom Kim, Chihun In, Seung Hoon Yang, Sooun Lee, Seung Young Seo, Jehyun Kim, Chul Ho Lee, Wooyoung Shim, Moon Ho Jo, Dohun Kim, Hyunyong Choi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a computer algorithm for layer number estimation of few-layered two-dimensional materials. Based on the optical contrast method, this algorithm analyzes an optical microscope image in a few seconds with high accuracy over 90%.

Original languageEnglish
Title of host publication2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781943580422
Publication statusPublished - 2018 Aug 6
Event2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States
Duration: 2018 May 132018 May 18

Publication series

Name2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Other

Other2018 Conference on Lasers and Electro-Optics, CLEO 2018
CountryUnited States
CitySan Jose
Period18/5/1318/5/18

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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