A fast, accurate and widely applicable computer algorithm for estimating layer number of two- dimensional materials

Seungwan Cho, Jekwan Lee, Soohyun Park, Hyemin Bae, Minji Noh, Beom Kim, Chihun In, Seung Hoon Yang, Sooun Lee, Seung Young Seo, Jehyun Kim, Chul-Ho Lee, Wooyoung Shim, Moon Ho Jo, Dohun Kim, Hyunyong Choi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a computer algorithm for layer number estimation of few-layered twodimensional materials. Based on the optical contrast method, this algorithm analyzes an optical microscope image in a few seconds with high accuracy over 90%.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationApplications and Technology, CLEO_AT 2018
PublisherOSA - The Optical Society
VolumePart F92-CLEO_AT 2018
ISBN (Electronic)9781557528209
DOIs
Publication statusPublished - 2018 Jan 1
EventCLEO: Applications and Technology, CLEO_AT 2018 - San Jose, United States
Duration: 2018 May 132018 May 18

Other

OtherCLEO: Applications and Technology, CLEO_AT 2018
CountryUnited States
CitySan Jose
Period18/5/1318/5/18

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Fingerprint Dive into the research topics of 'A fast, accurate and widely applicable computer algorithm for estimating layer number of two- dimensional materials'. Together they form a unique fingerprint.

  • Cite this

    Cho, S., Lee, J., Park, S., Bae, H., Noh, M., Kim, B., In, C., Yang, S. H., Lee, S., Seo, S. Y., Kim, J., Lee, C-H., Shim, W., Jo, M. H., Kim, D., & Choi, H. (2018). A fast, accurate and widely applicable computer algorithm for estimating layer number of two- dimensional materials. In CLEO: Applications and Technology, CLEO_AT 2018 (Vol. Part F92-CLEO_AT 2018). OSA - The Optical Society. https://doi.org/10.1364/CLEO_AT.2018.JTh2A.172