Abstract
This brief introduces a low-noise slew-rate/impedance-controlled high-speed output driver in 0.18- μm CMOS process. The output driver adopts an open-loop structure that enables the system to take only a single cycle to control the signal slew-rate or driver impedance. The control blocks consume 4.907 mA at 1 Gb/s. The proposed output driver is designed to maintain the data slew rate in the range of 2.13.6 V/ns. The proposed scheme is also applied to a pseudo-open-drain output driver, and the maximum and minimum variations of the impedance are +1.78% and -1.30%, respectively.
Original language | English |
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Article number | 5420307 |
Pages (from-to) | 120-125 |
Number of pages | 6 |
Journal | IEEE Transactions on Circuits and Systems II: Express Briefs |
Volume | 57 |
Issue number | 2 |
DOIs | |
Publication status | Published - 2010 Feb |
Keywords
- Electromagnetic interference (EMI)
- Fast compensation
- Low power
- Process, voltage, and temperature (PVT) variation detection
- Slew rate
ASJC Scopus subject areas
- Electrical and Electronic Engineering