A highly reliable multi-cell antifuse scheme using DRAM cell capacitors

Jong Pil Son, Jin Ho Kim, Woo Song Ahn, Seung Uk Han, Byung Sick Moon, Churoo Park, Hong Sun Hwang, Seong Jin Jang, Joo Sun Choi, Young Hyun Jun, Soo Won Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

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Engineering & Materials Science