A new method for evaluating postacne scarring

Jin Woong Lee, Beom Joon Kim, Myeung Nam Kim, Young Hwan Choi, Kyungrok Kim, Een Jun Hwang

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)384-385
Number of pages2
JournalSkin Research and Technology
Volume18
Issue number3
DOIs
Publication statusPublished - 2012 Aug 1

ASJC Scopus subject areas

  • Dermatology

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