A noise immunity effective read-out architecture for uncooled infrared detector

Sang Joon Hwang, Seung Woo Hong, Sang Won Park, Jee Young Yoon, Man Young Sung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

CMOS Read-Out IC (ROIC) for the micro Bolometer type Infrared Sensor is to estimate voltage or current when resistance in bolometer sensor varies as infrared light radiates. Implemented ROIC patterns cannot be exactly same with LAYOUT pattern CMOS Read-out IC process. Also each bolometer pixel resistance is variable by process variation in uncooled Infrared Sensor process. Bolometer sensor is not only heated by the incident IR, but also by current flowing through it, which generates the bias-heating noise. In this paper, we present CMOS Read-out IC which used a fully differential input stage to reduce process variation and bias heating noise problems. We designed and fabricated a prototype readout integrated circuit intended for uncooled bolometer infrared focal plane array. The design is demonstrated by the fabrication of a prototype consisting of an array of 32 × 32 pixels. The prototypes are fabricated in 0.25 μm CMOS process.

Original languageEnglish
Title of host publication2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
Pages639-642
Number of pages4
DOIs
Publication statusPublished - 2006 Dec 1
Externally publishedYes
Event2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC - Howloon, Hong Kong
Duration: 2005 Dec 192005 Dec 21

Other

Other2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
CountryHong Kong
CityHowloon
Period05/12/1905/12/21

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Keywords

  • Integrator
  • Read-out IC
  • Uncooled infrared bolometer sensor

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Hwang, S. J., Hong, S. W., Park, S. W., Yoon, J. Y., & Sung, M. Y. (2006). A noise immunity effective read-out architecture for uncooled infrared detector. In 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC (pp. 639-642). [1635355] https://doi.org/10.1109/EDSSC.2005.1635355