A novel burn-in potential region detection method using image processing technique

Yong Goo Shin; Dae Hong Lee; Mun Cheon Kang; Jeisung Lee; Sung-Jea Ko

doi:10.1109/ICCE.2017.7889289

A novel burn-in potential region detection method using image processing technique

Yong Goo Shin, Dae Hong Lee, Mun Cheon Kang, Jeisung Lee, Sung-Jea Ko

School of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power efficiency. However, the luminance degradation of the OLEDs, called burn-in, is still one of the major problems. This paper presents a novel method of detecting the burn-in potential region (BPR) to alleviate the luminance degradation. First, in order to extract the burn-in potential pixels (BPPs) which deteriorate the uniformity of the display, we calculate the remaining lifetime of OLED of each pixel. Then, the BPRs are detected by the level set based image segmentation using the BPPs as the seed points. The experimental results demonstrate that the proposed method detects BPRs with superior effectiveness compared with other alternative methods.

Original language	English
Title of host publication	2017 IEEE International Conference on Consumer Electronics, ICCE 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	215-216
Number of pages	2
ISBN (Electronic)	9781509055449
DOIs	https://doi.org/10.1109/ICCE.2017.7889289
Publication status	Published - 2017 Mar 29
Event	2017 IEEE International Conference on Consumer Electronics, ICCE 2017 - Las Vegas, United States Duration: 2017 Jan 8 → 2017 Jan 10

Other

Other	2017 IEEE International Conference on Consumer Electronics, ICCE 2017
Country	United States
City	Las Vegas
Period	17/1/8 → 17/1/10

ASJC Scopus subject areas

Computer Networks and Communications
Electrical and Electronic Engineering
Instrumentation

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Cite this

A novel burn-in potential region detection method using image processing technique. / Shin, Yong Goo; Lee, Dae Hong; Kang, Mun Cheon; Lee, Jeisung; Ko, Sung-Jea.

2017 IEEE International Conference on Consumer Electronics, ICCE 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 215-216 7889289.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Shin, YG, Lee, DH, Kang, MC, Lee, J & Ko, S-J 2017, A novel burn-in potential region detection method using image processing technique. in 2017 IEEE International Conference on Consumer Electronics, ICCE 2017., 7889289, Institute of Electrical and Electronics Engineers Inc., pp. 215-216, 2017 IEEE International Conference on Consumer Electronics, ICCE 2017, Las Vegas, United States, 17/1/8. https://doi.org/10.1109/ICCE.2017.7889289

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title = "A novel burn-in potential region detection method using image processing technique",

abstract = "The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power efficiency. However, the luminance degradation of the OLEDs, called burn-in, is still one of the major problems. This paper presents a novel method of detecting the burn-in potential region (BPR) to alleviate the luminance degradation. First, in order to extract the burn-in potential pixels (BPPs) which deteriorate the uniformity of the display, we calculate the remaining lifetime of OLED of each pixel. Then, the BPRs are detected by the level set based image segmentation using the BPPs as the seed points. The experimental results demonstrate that the proposed method detects BPRs with superior effectiveness compared with other alternative methods.",

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