A novel burn-in potential region detection method using image processing technique

Yong Goo Shin, Dae Hong Lee, Mun Cheon Kang, Jeisung Lee, Sung-Jea Ko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power efficiency. However, the luminance degradation of the OLEDs, called burn-in, is still one of the major problems. This paper presents a novel method of detecting the burn-in potential region (BPR) to alleviate the luminance degradation. First, in order to extract the burn-in potential pixels (BPPs) which deteriorate the uniformity of the display, we calculate the remaining lifetime of OLED of each pixel. Then, the BPRs are detected by the level set based image segmentation using the BPPs as the seed points. The experimental results demonstrate that the proposed method detects BPRs with superior effectiveness compared with other alternative methods.

Original languageEnglish
Title of host publication2017 IEEE International Conference on Consumer Electronics, ICCE 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages215-216
Number of pages2
ISBN (Electronic)9781509055449
DOIs
Publication statusPublished - 2017 Mar 29
Event2017 IEEE International Conference on Consumer Electronics, ICCE 2017 - Las Vegas, United States
Duration: 2017 Jan 82017 Jan 10

Other

Other2017 IEEE International Conference on Consumer Electronics, ICCE 2017
CountryUnited States
CityLas Vegas
Period17/1/817/1/10

Fingerprint

burn-in
Organic light emitting diodes (OLED)
image processing
Image processing
Pixels
Luminance
pixels
luminance
Display devices
Degradation
light emitting diodes
degradation
Image segmentation
Image quality
Seed
multimedia
power efficiency
seeds
life (durability)

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Instrumentation

Cite this

Shin, Y. G., Lee, D. H., Kang, M. C., Lee, J., & Ko, S-J. (2017). A novel burn-in potential region detection method using image processing technique. In 2017 IEEE International Conference on Consumer Electronics, ICCE 2017 (pp. 215-216). [7889289] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCE.2017.7889289

A novel burn-in potential region detection method using image processing technique. / Shin, Yong Goo; Lee, Dae Hong; Kang, Mun Cheon; Lee, Jeisung; Ko, Sung-Jea.

2017 IEEE International Conference on Consumer Electronics, ICCE 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 215-216 7889289.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Shin, YG, Lee, DH, Kang, MC, Lee, J & Ko, S-J 2017, A novel burn-in potential region detection method using image processing technique. in 2017 IEEE International Conference on Consumer Electronics, ICCE 2017., 7889289, Institute of Electrical and Electronics Engineers Inc., pp. 215-216, 2017 IEEE International Conference on Consumer Electronics, ICCE 2017, Las Vegas, United States, 17/1/8. https://doi.org/10.1109/ICCE.2017.7889289
Shin YG, Lee DH, Kang MC, Lee J, Ko S-J. A novel burn-in potential region detection method using image processing technique. In 2017 IEEE International Conference on Consumer Electronics, ICCE 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 215-216. 7889289 https://doi.org/10.1109/ICCE.2017.7889289
Shin, Yong Goo ; Lee, Dae Hong ; Kang, Mun Cheon ; Lee, Jeisung ; Ko, Sung-Jea. / A novel burn-in potential region detection method using image processing technique. 2017 IEEE International Conference on Consumer Electronics, ICCE 2017. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 215-216
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