A novel burn-in potential region detection method using image processing technique

Yong Goo Shin, Dae Hong Lee, Mun Cheon Kang, Jeisung Lee, Sung Jea Ko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power efficiency. However, the luminance degradation of the OLEDs, called burn-in, is still one of the major problems. This paper presents a novel method of detecting the burn-in potential region (BPR) to alleviate the luminance degradation. First, in order to extract the burn-in potential pixels (BPPs) which deteriorate the uniformity of the display, we calculate the remaining lifetime of OLED of each pixel. Then, the BPRs are detected by the level set based image segmentation using the BPPs as the seed points. The experimental results demonstrate that the proposed method detects BPRs with superior effectiveness compared with other alternative methods.

Original languageEnglish
Title of host publication2017 IEEE International Conference on Consumer Electronics, ICCE 2017
EditorsDaniel Diaz Sanchez, Jong-Hyouk Lee, Fernando Pescador
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages215-216
Number of pages2
ISBN (Electronic)9781509055449
DOIs
Publication statusPublished - 2017 Mar 29
Event2017 IEEE International Conference on Consumer Electronics, ICCE 2017 - Las Vegas, United States
Duration: 2017 Jan 82017 Jan 10

Publication series

Name2017 IEEE International Conference on Consumer Electronics, ICCE 2017

Other

Other2017 IEEE International Conference on Consumer Electronics, ICCE 2017
Country/TerritoryUnited States
CityLas Vegas
Period17/1/817/1/10

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering
  • Instrumentation

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