Abstract
The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power efficiency. However, the luminance degradation of the OLEDs, called burn-in, is still one of the major problems. This paper presents a novel method of detecting the burn-in potential region (BPR) to alleviate the luminance degradation. First, in order to extract the burn-in potential pixels (BPPs) which deteriorate the uniformity of the display, we calculate the remaining lifetime of OLED of each pixel. Then, the BPRs are detected by the level set based image segmentation using the BPPs as the seed points. The experimental results demonstrate that the proposed method detects BPRs with superior effectiveness compared with other alternative methods.
| Original language | English |
|---|---|
| Title of host publication | 2017 IEEE International Conference on Consumer Electronics, ICCE 2017 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 215-216 |
| Number of pages | 2 |
| ISBN (Electronic) | 9781509055449 |
| DOIs | |
| Publication status | Published - 2017 Mar 29 |
| Event | 2017 IEEE International Conference on Consumer Electronics, ICCE 2017 - Las Vegas, United States Duration: 2017 Jan 8 → 2017 Jan 10 |
Other
| Other | 2017 IEEE International Conference on Consumer Electronics, ICCE 2017 |
|---|---|
| Country | United States |
| City | Las Vegas |
| Period | 17/1/8 → 17/1/10 |
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ASJC Scopus subject areas
- Computer Networks and Communications
- Electrical and Electronic Engineering
- Instrumentation
Cite this
A novel burn-in potential region detection method using image processing technique. / Shin, Yong Goo; Lee, Dae Hong; Kang, Mun Cheon; Lee, Jeisung; Ko, Sung-Jea.
2017 IEEE International Conference on Consumer Electronics, ICCE 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 215-216 7889289.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - A novel burn-in potential region detection method using image processing technique
AU - Shin, Yong Goo
AU - Lee, Dae Hong
AU - Kang, Mun Cheon
AU - Lee, Jeisung
AU - Ko, Sung-Jea
PY - 2017/3/29
Y1 - 2017/3/29
N2 - The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power efficiency. However, the luminance degradation of the OLEDs, called burn-in, is still one of the major problems. This paper presents a novel method of detecting the burn-in potential region (BPR) to alleviate the luminance degradation. First, in order to extract the burn-in potential pixels (BPPs) which deteriorate the uniformity of the display, we calculate the remaining lifetime of OLED of each pixel. Then, the BPRs are detected by the level set based image segmentation using the BPPs as the seed points. The experimental results demonstrate that the proposed method detects BPRs with superior effectiveness compared with other alternative methods.
AB - The organic light emitting diode (OLED) display has been widely adopted to various multimedia devices with superior performance in terms of image quality and power efficiency. However, the luminance degradation of the OLEDs, called burn-in, is still one of the major problems. This paper presents a novel method of detecting the burn-in potential region (BPR) to alleviate the luminance degradation. First, in order to extract the burn-in potential pixels (BPPs) which deteriorate the uniformity of the display, we calculate the remaining lifetime of OLED of each pixel. Then, the BPRs are detected by the level set based image segmentation using the BPPs as the seed points. The experimental results demonstrate that the proposed method detects BPRs with superior effectiveness compared with other alternative methods.
UR - http://www.scopus.com/inward/record.url?scp=85018254021&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85018254021&partnerID=8YFLogxK
U2 - 10.1109/ICCE.2017.7889289
DO - 10.1109/ICCE.2017.7889289
M3 - Conference contribution
AN - SCOPUS:85018254021
SP - 215
EP - 216
BT - 2017 IEEE International Conference on Consumer Electronics, ICCE 2017
PB - Institute of Electrical and Electronics Engineers Inc.
ER -