A novel ultrafine particle mesurement system with an electrometer

Sang Soo Park, Chang Jin Lee, Soo Won Kim, Seung Bok Lee, Gwi Nam Bae, Kil Choo Moon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In this study, a novel ultra fine particle measurement system using condensation and charging techniques was proposed. It consisted of the inlet / size separation part for selecting particles in the bounded-size range, a uniform growth unit for deriving the condensation of ultra fine particles, an aerosol charger for charging particles grown uniformly in the growth unit, a Faraday cage / ammeter part for measuring ultra low current about 10 -13 A induced by charged-particles collected on the filter in Faraday cage, and a communication network part for monitoring particle data in real time. The particle phenomena occurred in major components of the ultra fine particle measurement system was introduced and the ammeter circuit used in this work was described in detail. The performance of the prototype ammeter was comparable with a commercial one.

Original languageEnglish
Title of host publication2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005
Pages227-230
Number of pages4
DOIs
Publication statusPublished - 2005
Event2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005 - Cincinnati, OH, United States
Duration: 2005 Aug 72005 Aug 10

Publication series

NameMidwest Symposium on Circuits and Systems
Volume2005
ISSN (Print)1548-3746

Other

Other2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005
CountryUnited States
CityCincinnati, OH
Period05/8/705/8/10

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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  • Cite this

    Park, S. S., Lee, C. J., Kim, S. W., Lee, S. B., Bae, G. N., & Moon, K. C. (2005). A novel ultrafine particle mesurement system with an electrometer. In 2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005 (pp. 227-230). [1594080] (Midwest Symposium on Circuits and Systems; Vol. 2005). https://doi.org/10.1109/MWSCAS.2005.1594080