A novel ultrafine particle mesurement system with an electrometer

Sang Soo Park, Chang Jin Lee, Soo-Won Kim, Seung Bok Lee, Gwi Nam Bae, Kil Choo Moon

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

In this study, a novel ultra fine particle measurement system using condensation and charging techniques was proposed. It consisted of the inlet / size separation part for selecting particles in the bounded-size range, a uniform growth unit for deriving the condensation of ultra fine particles, an aerosol charger for charging particles grown uniformly in the growth unit, a Faraday cage / ammeter part for measuring ultra low current about 10 -13 A induced by charged-particles collected on the filter in Faraday cage, and a communication network part for monitoring particle data in real time. The particle phenomena occurred in major components of the ultra fine particle measurement system was introduced and the ammeter circuit used in this work was described in detail. The performance of the prototype ammeter was comparable with a commercial one.

Original languageEnglish
Title of host publicationMidwest Symposium on Circuits and Systems
Pages227-230
Number of pages4
Volume2005
DOIs
Publication statusPublished - 2005 Dec 1
Event2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005 - Cincinnati, OH, United States
Duration: 2005 Aug 72005 Aug 10

Other

Other2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005
CountryUnited States
CityCincinnati, OH
Period05/8/705/8/10

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Park, S. S., Lee, C. J., Kim, S-W., Lee, S. B., Bae, G. N., & Moon, K. C. (2005). A novel ultrafine particle mesurement system with an electrometer. In Midwest Symposium on Circuits and Systems (Vol. 2005, pp. 227-230). [1594080] https://doi.org/10.1109/MWSCAS.2005.1594080