A portable I 2-stabilized Nd

YAG laser for wavelength standards at 532 nm and 1064 nm

Feng Lei Hong, Jun Ishikawa, Tai Hyun Yoon, Long Sheng Ma, Jun Ye, John L. Hall

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)

Abstract

We have established a portable I 2-stabilized Nd:YAG laser for the purpose of making wavelength standards at 532 nm and 1064 nm. All the optical parts of the laser system were arranged on a 45 cm × 45 cm breadboard. The system was transported from NRLM to JILA for frequency comparison. The results of the comparison show that the Allan Variance of the portable laser reached < 3 × 10 -13 when the integration time τ is larger than 100 s. The frequency differences between the NRLM and JILA lasers during 3-day measurements were consistent within ± 35 Hz (at 1064 nm), but the matrix-averaged standard deviation of about 310 Hz, and offset are regarded as not yet fully satisfactory. The stability of the portable laser was further improved to about 3 × 10 -14 (at the flicker floor, τ = 300 s) by using a longer iodine cell and several frequency stabilization techniques.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsJ.E. Decker, N Brown
Pages2-10
Number of pages9
Volume3477
DOIs
Publication statusPublished - 1998
Externally publishedYes
EventRecent Developments in Optical Gauge Block Metrology - San DIego, CA, United States
Duration: 1998 Jul 201998 Jul 21

Other

OtherRecent Developments in Optical Gauge Block Metrology
CountryUnited States
CitySan DIego, CA
Period98/7/2098/7/21

Fingerprint

YAG lasers
Wavelength
Lasers
wavelengths
lasers
flicker
iodine
standard deviation
Iodine
stabilization
Stabilization
matrices
cells

Keywords

  • Comparison of laser frequency
  • High resolution spectroscopy
  • Laser frequency stabilization
  • Modulation-transfer spectroscopy
  • Optical frequency standard
  • Wavelength standard

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Hong, F. L., Ishikawa, J., Yoon, T. H., Ma, L. S., Ye, J., & Hall, J. L. (1998). A portable I 2-stabilized Nd: YAG laser for wavelength standards at 532 nm and 1064 nm. In J. E. Decker, & N. Brown (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3477, pp. 2-10) https://doi.org/10.1117/12.323092

A portable I 2-stabilized Nd : YAG laser for wavelength standards at 532 nm and 1064 nm. / Hong, Feng Lei; Ishikawa, Jun; Yoon, Tai Hyun; Ma, Long Sheng; Ye, Jun; Hall, John L.

Proceedings of SPIE - The International Society for Optical Engineering. ed. / J.E. Decker; N Brown. Vol. 3477 1998. p. 2-10.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hong, FL, Ishikawa, J, Yoon, TH, Ma, LS, Ye, J & Hall, JL 1998, A portable I 2-stabilized Nd: YAG laser for wavelength standards at 532 nm and 1064 nm. in JE Decker & N Brown (eds), Proceedings of SPIE - The International Society for Optical Engineering. vol. 3477, pp. 2-10, Recent Developments in Optical Gauge Block Metrology, San DIego, CA, United States, 98/7/20. https://doi.org/10.1117/12.323092
Hong FL, Ishikawa J, Yoon TH, Ma LS, Ye J, Hall JL. A portable I 2-stabilized Nd: YAG laser for wavelength standards at 532 nm and 1064 nm. In Decker JE, Brown N, editors, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3477. 1998. p. 2-10 https://doi.org/10.1117/12.323092
Hong, Feng Lei ; Ishikawa, Jun ; Yoon, Tai Hyun ; Ma, Long Sheng ; Ye, Jun ; Hall, John L. / A portable I 2-stabilized Nd : YAG laser for wavelength standards at 532 nm and 1064 nm. Proceedings of SPIE - The International Society for Optical Engineering. editor / J.E. Decker ; N Brown. Vol. 3477 1998. pp. 2-10
@inproceedings{10c0f0e790e94adba5d01a3243d6a818,
title = "A portable I 2-stabilized Nd: YAG laser for wavelength standards at 532 nm and 1064 nm",
abstract = "We have established a portable I 2-stabilized Nd:YAG laser for the purpose of making wavelength standards at 532 nm and 1064 nm. All the optical parts of the laser system were arranged on a 45 cm × 45 cm breadboard. The system was transported from NRLM to JILA for frequency comparison. The results of the comparison show that the Allan Variance of the portable laser reached < 3 × 10 -13 when the integration time τ is larger than 100 s. The frequency differences between the NRLM and JILA lasers during 3-day measurements were consistent within ± 35 Hz (at 1064 nm), but the matrix-averaged standard deviation of about 310 Hz, and offset are regarded as not yet fully satisfactory. The stability of the portable laser was further improved to about 3 × 10 -14 (at the flicker floor, τ = 300 s) by using a longer iodine cell and several frequency stabilization techniques.",
keywords = "Comparison of laser frequency, High resolution spectroscopy, Laser frequency stabilization, Modulation-transfer spectroscopy, Optical frequency standard, Wavelength standard",
author = "Hong, {Feng Lei} and Jun Ishikawa and Yoon, {Tai Hyun} and Ma, {Long Sheng} and Jun Ye and Hall, {John L.}",
year = "1998",
doi = "10.1117/12.323092",
language = "English",
volume = "3477",
pages = "2--10",
editor = "J.E. Decker and N Brown",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

}

TY - GEN

T1 - A portable I 2-stabilized Nd

T2 - YAG laser for wavelength standards at 532 nm and 1064 nm

AU - Hong, Feng Lei

AU - Ishikawa, Jun

AU - Yoon, Tai Hyun

AU - Ma, Long Sheng

AU - Ye, Jun

AU - Hall, John L.

PY - 1998

Y1 - 1998

N2 - We have established a portable I 2-stabilized Nd:YAG laser for the purpose of making wavelength standards at 532 nm and 1064 nm. All the optical parts of the laser system were arranged on a 45 cm × 45 cm breadboard. The system was transported from NRLM to JILA for frequency comparison. The results of the comparison show that the Allan Variance of the portable laser reached < 3 × 10 -13 when the integration time τ is larger than 100 s. The frequency differences between the NRLM and JILA lasers during 3-day measurements were consistent within ± 35 Hz (at 1064 nm), but the matrix-averaged standard deviation of about 310 Hz, and offset are regarded as not yet fully satisfactory. The stability of the portable laser was further improved to about 3 × 10 -14 (at the flicker floor, τ = 300 s) by using a longer iodine cell and several frequency stabilization techniques.

AB - We have established a portable I 2-stabilized Nd:YAG laser for the purpose of making wavelength standards at 532 nm and 1064 nm. All the optical parts of the laser system were arranged on a 45 cm × 45 cm breadboard. The system was transported from NRLM to JILA for frequency comparison. The results of the comparison show that the Allan Variance of the portable laser reached < 3 × 10 -13 when the integration time τ is larger than 100 s. The frequency differences between the NRLM and JILA lasers during 3-day measurements were consistent within ± 35 Hz (at 1064 nm), but the matrix-averaged standard deviation of about 310 Hz, and offset are regarded as not yet fully satisfactory. The stability of the portable laser was further improved to about 3 × 10 -14 (at the flicker floor, τ = 300 s) by using a longer iodine cell and several frequency stabilization techniques.

KW - Comparison of laser frequency

KW - High resolution spectroscopy

KW - Laser frequency stabilization

KW - Modulation-transfer spectroscopy

KW - Optical frequency standard

KW - Wavelength standard

UR - http://www.scopus.com/inward/record.url?scp=0032224068&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032224068&partnerID=8YFLogxK

U2 - 10.1117/12.323092

DO - 10.1117/12.323092

M3 - Conference contribution

VL - 3477

SP - 2

EP - 10

BT - Proceedings of SPIE - The International Society for Optical Engineering

A2 - Decker, J.E.

A2 - Brown, N

ER -