A robust contrast enhancement method for automatic TFT-LCD module inspection

Jinkyu Kim, Jinkoo Kim, Jeonghoon Seo, Euiyeol Oh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

An automated detection of defect in TFT-LCD manufacturing is critical to maintain high-quality TFT-LCD production. However, various types of defect and their low SNR make it challenging, and therefore fully automated defect detection is still unresolved. In this paper, we propose a robust method for defect detection combining high-resolution image acquisition technique and image processing techniques. The proposed method shows significantly improved performance in defect detection enough to detect undergray (≤1gray) defect.

Original languageEnglish
Title of host publication31st International Display Research Conference 2011, EuroDisplay 2011
Pages53-55
Number of pages3
Publication statusPublished - 2011
Externally publishedYes
Event31st International Display Research Conference 2011, EuroDisplay 2011 - Arcachon, France
Duration: 2011 Sep 192011 Sep 22

Publication series

NameSID Conference Record of the International Display Research Conference
ISSN (Print)1083-1312

Conference

Conference31st International Display Research Conference 2011, EuroDisplay 2011
Country/TerritoryFrance
CityArcachon
Period11/9/1911/9/22

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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