A Spread Spectrum Clock Generator with Nested Modulation Profile for High-Resolution Display System

Jaehun Jun; Sang Geun Bae; Yeonho Lee; Chulwoo Kim

doi:10.1109/TCSII.2017.2742517

A Spread Spectrum Clock Generator with Nested Modulation Profile for High-Resolution Display System

Jaehun Jun, Sang Geun Bae, Yeonho Lee, Chulwoo Kim

School of Electrical Engineering

Research output: Contribution to journal › Article

1 Citation (Scopus)

Abstract

A spread-spectrum clock generator is implemented using a nested modulation profile to reduce the peak power levels of radiated electro-magnetic emissions in display products. The display data interface is a potential source of interference, and the spread spectrum technique has been extensively used for display interfaces. The proposed nested profile can further reduce EMI without any degradation in the other characteristics. A test chip was fabricated using a 55nm CMOS process, and the test results indicate a 41dB reduction. The sensitivity of a wireless receiver to interference is tested, and the EVM results for the proposed nested profile exhibits an improvement of 1.4dB compared to those of the triangular profile.

Original language	English
Journal	IEEE Transactions on Circuits and Systems II: Express Briefs
DOIs	https://doi.org/10.1109/TCSII.2017.2742517
Publication status	Accepted/In press - 2017 Aug 22

Keywords

Clocks
display interface.
Electromagnetic interference
EMI
Frequency modulation
Jitter
nested modulation profile
Radiation detectors
Spread spectrum clock
wireless interference

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1109/TCSII.2017.2742517

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Jun, J., Bae, S. G., Lee, Y., & Kim, C. (Accepted/In press). A Spread Spectrum Clock Generator with Nested Modulation Profile for High-Resolution Display System. IEEE Transactions on Circuits and Systems II: Express Briefs. https://doi.org/10.1109/TCSII.2017.2742517

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abstract = "A spread-spectrum clock generator is implemented using a nested modulation profile to reduce the peak power levels of radiated electro-magnetic emissions in display products. The display data interface is a potential source of interference, and the spread spectrum technique has been extensively used for display interfaces. The proposed nested profile can further reduce EMI without any degradation in the other characteristics. A test chip was fabricated using a 55nm CMOS process, and the test results indicate a 41dB reduction. The sensitivity of a wireless receiver to interference is tested, and the EVM results for the proposed nested profile exhibits an improvement of 1.4dB compared to those of the triangular profile.",

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