A study on the microstructure of preferred orientation of lead zirconate titanate (PZT) thin films

Chang Jung Kim, Dae Sung Yoon, Joon Sung Lee, Chaun Gi Choi, Kwangsoo No

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11 Citations (Scopus)

Abstract

The lead zirconate titanate (PZT) thin films were fabricated using sol-gel spin coating onto Pt/Ti/glass substrates. Effects of the holding time for pyrolysis and the coating cycle on the preferred orientation of the PZT thin films were studied. The films were fabricated with different coating cycles (3, 5, 7, 9, 11), dried at 330 °C for different holding times (5, 30, 60 min), and then annealed at the same temperature of 650 °C using rapid thermal annealing (RTA). The preferred orientations of the films were investigated using x-ray diffraction and glancing angle x-ray diffraction. The microstructure and the selected area diffraction pattern of the PZT thin films were also investigated using scanning electron microscopy (SEM) and transmission electron microscopy (TEM), respectively.

Original languageEnglish
Pages (from-to)1043-1047
Number of pages5
JournalJournal of Materials Research
Volume12
Issue number4
DOIs
Publication statusPublished - 1997 Apr

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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