A study on the optoelectronic properties of CuInL1-xGa xSe2 grain boundaries by electrostatic force microscopy

Yoon Mook Kang, Jae Ho Yun, Kyung Hoon Yoon, K. S. Jeon, Yung Doug Suh, Donghwan Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We investigated the electric charge distribution in CuIn 1-xGaxSe2 films, with particular emphasis on grain boundaries. Hall measurements, electron beaminduced current and optical beam-induced current measurements are commonly used for the characterization of solar cells, but they do not provide the resolution necessary for the investigation of individual grain boundaries. Therefore, we used an electrostatic force microscopy (EFM) capable of probing the electric charge distribution and the potential gradient of sample surface. EFM experiments were performed at 300K with a Dimension ™ 3100 scanning probe microscope (Digital Instruments). We suggest that grain boundaries should be electron-accumulated area and the inner grain area be the hole-accumulated area. The potential variations between the grain boundaries and inner grain area were estimated to be 60-180meV.

Original languageEnglish
Title of host publicationConference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4
Pages516-518
Number of pages3
Volume1
DOIs
Publication statusPublished - 2007 Dec 1
Event2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4 - Waikoloa, HI, United States
Duration: 2006 May 72006 May 12

Other

Other2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4
CountryUnited States
CityWaikoloa, HI
Period06/5/706/5/12

Fingerprint

Electrostatic force
Optoelectronic devices
Microscopic examination
Grain boundaries
Electric charge
Charge distribution
Digital instruments
Electrons
Induced currents
Electric current measurement
Solar cells
Microscopes
Scanning
Experiments

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry

Cite this

Kang, Y. M., Yun, J. H., Yoon, K. H., Jeon, K. S., Suh, Y. D., & Kim, D. (2007). A study on the optoelectronic properties of CuInL1-xGa xSe2 grain boundaries by electrostatic force microscopy. In Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4 (Vol. 1, pp. 516-518). [4059678] https://doi.org/10.1109/WCPEC.2006.279505

A study on the optoelectronic properties of CuInL1-xGa xSe2 grain boundaries by electrostatic force microscopy. / Kang, Yoon Mook; Yun, Jae Ho; Yoon, Kyung Hoon; Jeon, K. S.; Suh, Yung Doug; Kim, Donghwan.

Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4. Vol. 1 2007. p. 516-518 4059678.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kang, YM, Yun, JH, Yoon, KH, Jeon, KS, Suh, YD & Kim, D 2007, A study on the optoelectronic properties of CuInL1-xGa xSe2 grain boundaries by electrostatic force microscopy. in Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4. vol. 1, 4059678, pp. 516-518, 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4, Waikoloa, HI, United States, 06/5/7. https://doi.org/10.1109/WCPEC.2006.279505
Kang YM, Yun JH, Yoon KH, Jeon KS, Suh YD, Kim D. A study on the optoelectronic properties of CuInL1-xGa xSe2 grain boundaries by electrostatic force microscopy. In Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4. Vol. 1. 2007. p. 516-518. 4059678 https://doi.org/10.1109/WCPEC.2006.279505
Kang, Yoon Mook ; Yun, Jae Ho ; Yoon, Kyung Hoon ; Jeon, K. S. ; Suh, Yung Doug ; Kim, Donghwan. / A study on the optoelectronic properties of CuInL1-xGa xSe2 grain boundaries by electrostatic force microscopy. Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4. Vol. 1 2007. pp. 516-518
@inproceedings{00bfdd57555d4c7a9fe1c8bf288c7fe3,
title = "A study on the optoelectronic properties of CuInL1-xGa xSe2 grain boundaries by electrostatic force microscopy",
abstract = "We investigated the electric charge distribution in CuIn 1-xGaxSe2 films, with particular emphasis on grain boundaries. Hall measurements, electron beaminduced current and optical beam-induced current measurements are commonly used for the characterization of solar cells, but they do not provide the resolution necessary for the investigation of individual grain boundaries. Therefore, we used an electrostatic force microscopy (EFM) capable of probing the electric charge distribution and the potential gradient of sample surface. EFM experiments were performed at 300K with a Dimension ™ 3100 scanning probe microscope (Digital Instruments). We suggest that grain boundaries should be electron-accumulated area and the inner grain area be the hole-accumulated area. The potential variations between the grain boundaries and inner grain area were estimated to be 60-180meV.",
author = "Kang, {Yoon Mook} and Yun, {Jae Ho} and Yoon, {Kyung Hoon} and Jeon, {K. S.} and Suh, {Yung Doug} and Donghwan Kim",
year = "2007",
month = "12",
day = "1",
doi = "10.1109/WCPEC.2006.279505",
language = "English",
isbn = "1424400163",
volume = "1",
pages = "516--518",
booktitle = "Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4",

}

TY - GEN

T1 - A study on the optoelectronic properties of CuInL1-xGa xSe2 grain boundaries by electrostatic force microscopy

AU - Kang, Yoon Mook

AU - Yun, Jae Ho

AU - Yoon, Kyung Hoon

AU - Jeon, K. S.

AU - Suh, Yung Doug

AU - Kim, Donghwan

PY - 2007/12/1

Y1 - 2007/12/1

N2 - We investigated the electric charge distribution in CuIn 1-xGaxSe2 films, with particular emphasis on grain boundaries. Hall measurements, electron beaminduced current and optical beam-induced current measurements are commonly used for the characterization of solar cells, but they do not provide the resolution necessary for the investigation of individual grain boundaries. Therefore, we used an electrostatic force microscopy (EFM) capable of probing the electric charge distribution and the potential gradient of sample surface. EFM experiments were performed at 300K with a Dimension ™ 3100 scanning probe microscope (Digital Instruments). We suggest that grain boundaries should be electron-accumulated area and the inner grain area be the hole-accumulated area. The potential variations between the grain boundaries and inner grain area were estimated to be 60-180meV.

AB - We investigated the electric charge distribution in CuIn 1-xGaxSe2 films, with particular emphasis on grain boundaries. Hall measurements, electron beaminduced current and optical beam-induced current measurements are commonly used for the characterization of solar cells, but they do not provide the resolution necessary for the investigation of individual grain boundaries. Therefore, we used an electrostatic force microscopy (EFM) capable of probing the electric charge distribution and the potential gradient of sample surface. EFM experiments were performed at 300K with a Dimension ™ 3100 scanning probe microscope (Digital Instruments). We suggest that grain boundaries should be electron-accumulated area and the inner grain area be the hole-accumulated area. The potential variations between the grain boundaries and inner grain area were estimated to be 60-180meV.

UR - http://www.scopus.com/inward/record.url?scp=41749116859&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=41749116859&partnerID=8YFLogxK

U2 - 10.1109/WCPEC.2006.279505

DO - 10.1109/WCPEC.2006.279505

M3 - Conference contribution

SN - 1424400163

SN - 9781424400164

VL - 1

SP - 516

EP - 518

BT - Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4

ER -