A study on the optoelectronic properties of CuInL1-xGa xSe2 grain boundaries by electrostatic force microscopy

Yoonmook Kang, Jae Ho Yun, Kyung Hoon Yoon, K. S. Jeon, Yung Doug Suh, Donghwan Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We investigated the electric charge distribution in CuIn 1-xGaxSe2 films, with particular emphasis on grain boundaries. Hall measurements, electron beaminduced current and optical beam-induced current measurements are commonly used for the characterization of solar cells, but they do not provide the resolution necessary for the investigation of individual grain boundaries. Therefore, we used an electrostatic force microscopy (EFM) capable of probing the electric charge distribution and the potential gradient of sample surface. EFM experiments were performed at 300K with a Dimension ™ 3100 scanning probe microscope (Digital Instruments). We suggest that grain boundaries should be electron-accumulated area and the inner grain area be the hole-accumulated area. The potential variations between the grain boundaries and inner grain area were estimated to be 60-180meV.

Original languageEnglish
Title of host publicationConference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4
PublisherIEEE Computer Society
Pages516-518
Number of pages3
ISBN (Print)1424400163, 9781424400164
DOIs
Publication statusPublished - 2006
Event2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4 - Waikoloa, HI, United States
Duration: 2006 May 72006 May 12

Publication series

NameConference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4
Volume1

Other

Other2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4
CountryUnited States
CityWaikoloa, HI
Period06/5/706/5/12

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry

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    Kang, Y., Yun, J. H., Yoon, K. H., Jeon, K. S., Suh, Y. D., & Kim, D. (2006). A study on the optoelectronic properties of CuInL1-xGa xSe2 grain boundaries by electrostatic force microscopy. In Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4 (pp. 516-518). [4059678] (Conference Record of the 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion, WCPEC-4; Vol. 1). IEEE Computer Society. https://doi.org/10.1109/WCPEC.2006.279505