A Visual Explorer for Analyzing Trajectory Patterns

Wooil Kim, Changbeom Shim, Ilhyun Suh, Yon Dohn Chung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we propose a web-based interactive visual analytic system effective for revealing the trajectory patterns. We describe the analysis approach with the data of MC1 of the VAST challenge 2017. Index Terms - Visual analytics, Information visualization.

Original languageEnglish
Title of host publication2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings
EditorsTobias Schreck, Brian Fisher, Shixia Liu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages199-200
Number of pages2
ISBN (Electronic)9781538631638
DOIs
Publication statusPublished - 2018 Dec 21
Event2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Phoenix, United States
Duration: 2017 Oct 12017 Oct 6

Other

Other2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017
CountryUnited States
CityPhoenix
Period17/10/117/10/6

Fingerprint

Visualization
Trajectories

Keywords

  • Information visualization
  • Visual analytics

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Human-Computer Interaction
  • Information Systems
  • Media Technology

Cite this

Kim, W., Shim, C., Suh, I., & Chung, Y. D. (2018). A Visual Explorer for Analyzing Trajectory Patterns. In T. Schreck, B. Fisher, & S. Liu (Eds.), 2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings (pp. 199-200). [8585462] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VAST.2017.8585462

A Visual Explorer for Analyzing Trajectory Patterns. / Kim, Wooil; Shim, Changbeom; Suh, Ilhyun; Chung, Yon Dohn.

2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings. ed. / Tobias Schreck; Brian Fisher; Shixia Liu. Institute of Electrical and Electronics Engineers Inc., 2018. p. 199-200 8585462.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kim, W, Shim, C, Suh, I & Chung, YD 2018, A Visual Explorer for Analyzing Trajectory Patterns. in T Schreck, B Fisher & S Liu (eds), 2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings., 8585462, Institute of Electrical and Electronics Engineers Inc., pp. 199-200, 2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017, Phoenix, United States, 17/10/1. https://doi.org/10.1109/VAST.2017.8585462
Kim W, Shim C, Suh I, Chung YD. A Visual Explorer for Analyzing Trajectory Patterns. In Schreck T, Fisher B, Liu S, editors, 2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2018. p. 199-200. 8585462 https://doi.org/10.1109/VAST.2017.8585462
Kim, Wooil ; Shim, Changbeom ; Suh, Ilhyun ; Chung, Yon Dohn. / A Visual Explorer for Analyzing Trajectory Patterns. 2017 IEEE Conference on Visual Analytics Science and Technology, VAST 2017 - Proceedings. editor / Tobias Schreck ; Brian Fisher ; Shixia Liu. Institute of Electrical and Electronics Engineers Inc., 2018. pp. 199-200
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