Accurate wavelength calibration method for spectrometer using low coherence interferometry

Ji Hyun Kim, Jae Ho Han, Jichai Jeong

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

Dispersive spectrometers are subject to wavelength dispersion errors due to aberration, ruling errors, etc. Thus, their calibration forms an integral aspect of their usage. In this context, we present an interferometric wavelength calibration method for calibrating dispersive spectrometers. The calibration system is based on low coherence interferometry. By analyzing the sinusoidal interference patterns that are modulated in a spectrum, we determine the distribution of wavelengths in a spectrometer using the zero-crossing detection. The spectral sampling interval of the spectrometer is estimated by determining the sampling interval in the z-domain. Assigning only one wavelength to the corresponding camera pixel using a narrowband light source allows the determination of entire wavelengths accurately. We use the information of the wavelength distribution, spectral sampling interval, and wavelength data to achieve accurate calibration. Our experimental results show that the proposed method calibrates wavelength more accurately than conventional methods, since the interferometric calibration can reduce the wavelength fitting error arising from extrapolation. Moreover, the proposed calibration method can reduce the side-lobe amplitude maximally by 4.8 dB when applied to OCT imaging. We believe that our findings can significantly aid in the development of spectrometry.

Original languageEnglish
Article number7014224
Pages (from-to)3413-3418
Number of pages6
JournalJournal of Lightwave Technology
Volume33
Issue number16
DOIs
Publication statusPublished - 2015 Aug 15

Fingerprint

interferometry
spectrometers
wavelengths
sampling
intervals
roots of equations
calibrating
lobes
narrowband
extrapolation
aberration
light sources
pixels
cameras
interference
spectroscopy

Keywords

  • Calibration
  • Optical imaging
  • Spectroscopy

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Accurate wavelength calibration method for spectrometer using low coherence interferometry. / Kim, Ji Hyun; Han, Jae Ho; Jeong, Jichai.

In: Journal of Lightwave Technology, Vol. 33, No. 16, 7014224, 15.08.2015, p. 3413-3418.

Research output: Contribution to journalArticle

@article{87afb0203da74b00ae4814cf895356d6,
title = "Accurate wavelength calibration method for spectrometer using low coherence interferometry",
abstract = "Dispersive spectrometers are subject to wavelength dispersion errors due to aberration, ruling errors, etc. Thus, their calibration forms an integral aspect of their usage. In this context, we present an interferometric wavelength calibration method for calibrating dispersive spectrometers. The calibration system is based on low coherence interferometry. By analyzing the sinusoidal interference patterns that are modulated in a spectrum, we determine the distribution of wavelengths in a spectrometer using the zero-crossing detection. The spectral sampling interval of the spectrometer is estimated by determining the sampling interval in the z-domain. Assigning only one wavelength to the corresponding camera pixel using a narrowband light source allows the determination of entire wavelengths accurately. We use the information of the wavelength distribution, spectral sampling interval, and wavelength data to achieve accurate calibration. Our experimental results show that the proposed method calibrates wavelength more accurately than conventional methods, since the interferometric calibration can reduce the wavelength fitting error arising from extrapolation. Moreover, the proposed calibration method can reduce the side-lobe amplitude maximally by 4.8 dB when applied to OCT imaging. We believe that our findings can significantly aid in the development of spectrometry.",
keywords = "Calibration, Optical imaging, Spectroscopy",
author = "Kim, {Ji Hyun} and Han, {Jae Ho} and Jichai Jeong",
year = "2015",
month = "8",
day = "15",
doi = "10.1109/JLT.2015.2393881",
language = "English",
volume = "33",
pages = "3413--3418",
journal = "Journal of Lightwave Technology",
issn = "0733-8724",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "16",

}

TY - JOUR

T1 - Accurate wavelength calibration method for spectrometer using low coherence interferometry

AU - Kim, Ji Hyun

AU - Han, Jae Ho

AU - Jeong, Jichai

PY - 2015/8/15

Y1 - 2015/8/15

N2 - Dispersive spectrometers are subject to wavelength dispersion errors due to aberration, ruling errors, etc. Thus, their calibration forms an integral aspect of their usage. In this context, we present an interferometric wavelength calibration method for calibrating dispersive spectrometers. The calibration system is based on low coherence interferometry. By analyzing the sinusoidal interference patterns that are modulated in a spectrum, we determine the distribution of wavelengths in a spectrometer using the zero-crossing detection. The spectral sampling interval of the spectrometer is estimated by determining the sampling interval in the z-domain. Assigning only one wavelength to the corresponding camera pixel using a narrowband light source allows the determination of entire wavelengths accurately. We use the information of the wavelength distribution, spectral sampling interval, and wavelength data to achieve accurate calibration. Our experimental results show that the proposed method calibrates wavelength more accurately than conventional methods, since the interferometric calibration can reduce the wavelength fitting error arising from extrapolation. Moreover, the proposed calibration method can reduce the side-lobe amplitude maximally by 4.8 dB when applied to OCT imaging. We believe that our findings can significantly aid in the development of spectrometry.

AB - Dispersive spectrometers are subject to wavelength dispersion errors due to aberration, ruling errors, etc. Thus, their calibration forms an integral aspect of their usage. In this context, we present an interferometric wavelength calibration method for calibrating dispersive spectrometers. The calibration system is based on low coherence interferometry. By analyzing the sinusoidal interference patterns that are modulated in a spectrum, we determine the distribution of wavelengths in a spectrometer using the zero-crossing detection. The spectral sampling interval of the spectrometer is estimated by determining the sampling interval in the z-domain. Assigning only one wavelength to the corresponding camera pixel using a narrowband light source allows the determination of entire wavelengths accurately. We use the information of the wavelength distribution, spectral sampling interval, and wavelength data to achieve accurate calibration. Our experimental results show that the proposed method calibrates wavelength more accurately than conventional methods, since the interferometric calibration can reduce the wavelength fitting error arising from extrapolation. Moreover, the proposed calibration method can reduce the side-lobe amplitude maximally by 4.8 dB when applied to OCT imaging. We believe that our findings can significantly aid in the development of spectrometry.

KW - Calibration

KW - Optical imaging

KW - Spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=84938717710&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84938717710&partnerID=8YFLogxK

U2 - 10.1109/JLT.2015.2393881

DO - 10.1109/JLT.2015.2393881

M3 - Article

AN - SCOPUS:84938717710

VL - 33

SP - 3413

EP - 3418

JO - Journal of Lightwave Technology

JF - Journal of Lightwave Technology

SN - 0733-8724

IS - 16

M1 - 7014224

ER -