Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures

A. J L Adam, J. M. Brok, M. A. Seo, K. J. Ahn, D. S. Kim, J. H. Kang, Q Han Park, M. Nagel, P. C M Planken

Research output: Contribution to journalArticle

88 Citations (Scopus)

Abstract

Using terahertz-light excitation, we have measured with sub-wavelength spatial, and sub-cycle temporal resolution the time- and frequency-dependent electric-field and surface-charge density in the vicinity of small metallic holes. In addition to a singularity like concentration of the electric field near the hole edges, we observe, that holes can act as differential operators whose near-field output is the time-derivative of the incident electric field. Our results confirm the well-known predictions made by Bouwkamp, Philips Res. Rep. 5, 321-332 (1950), and reveal, with unprecedented detail, what physically happens when light passes through a small hole.

Original languageEnglish
Pages (from-to)7407-7417
Number of pages11
JournalOptics Express
Volume16
Issue number10
DOIs
Publication statusPublished - 2008 May 12

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near fields
apertures
wavelengths
electric fields
differential operators
temporal resolution
cycles
output
predictions
excitation

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

Cite this

Adam, A. J. L., Brok, J. M., Seo, M. A., Ahn, K. J., Kim, D. S., Kang, J. H., ... Planken, P. C. M. (2008). Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures. Optics Express, 16(10), 7407-7417. https://doi.org/10.1364/OE.16.007407

Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures. / Adam, A. J L; Brok, J. M.; Seo, M. A.; Ahn, K. J.; Kim, D. S.; Kang, J. H.; Park, Q Han; Nagel, M.; Planken, P. C M.

In: Optics Express, Vol. 16, No. 10, 12.05.2008, p. 7407-7417.

Research output: Contribution to journalArticle

Adam, AJL, Brok, JM, Seo, MA, Ahn, KJ, Kim, DS, Kang, JH, Park, QH, Nagel, M & Planken, PCM 2008, 'Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures', Optics Express, vol. 16, no. 10, pp. 7407-7417. https://doi.org/10.1364/OE.16.007407
Adam, A. J L ; Brok, J. M. ; Seo, M. A. ; Ahn, K. J. ; Kim, D. S. ; Kang, J. H. ; Park, Q Han ; Nagel, M. ; Planken, P. C M. / Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures. In: Optics Express. 2008 ; Vol. 16, No. 10. pp. 7407-7417.
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