All-Digital Duty-Cycle Corrector with a Wide Duty Correction Range for DRAM Applications

Chan Hui Jeong; Ammar Abdullah; Young Jae Min; In Chul Hwang; Soo-Won Kim

doi:10.1109/TVLSI.2015.2394486

All-Digital Duty-Cycle Corrector with a Wide Duty Correction Range for DRAM Applications

Chan Hui Jeong, Ammar Abdullah, Young Jae Min, In Chul Hwang, Soo-Won Kim

School of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

An all-digital duty-cycle corrector with a wide duty correction range and fast correction time is hereby presented. The proposed corrector uses a 1-bit digital duty-cycle detector with a time-to-digital converter, and it achieves a duty correction range between 10% and 90% with a low pressure, volume, and temperature variation. The test chip was fabricated using a 0.13-μm CMOS process, and it occupies an area of 0.059 mm². The correction cycle is a 14 cycles and the duty-cycle error is below ±1.4%. At an operating frequency of 1 GHz, the power dissipation and peak-to-peak jitter are measured at 5.6 mW and 20.5 ps, respectively.

Original language	English
Article number	7041224
Pages (from-to)	363-367
Number of pages	5
Journal	IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume	24
Issue number	1
DOIs	https://doi.org/10.1109/TVLSI.2015.2394486
Publication status	Published - 2016 Jan 1

Keywords

Digital comparator
double data rate
DRAM
duty-cycle corrector (DCC)
successive approximation register (SAR) controller

ASJC Scopus subject areas

Electrical and Electronic Engineering
Hardware and Architecture
Software

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10.1109/TVLSI.2015.2394486

Cite this

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abstract = "An all-digital duty-cycle corrector with a wide duty correction range and fast correction time is hereby presented. The proposed corrector uses a 1-bit digital duty-cycle detector with a time-to-digital converter, and it achieves a duty correction range between 10% and 90% with a low pressure, volume, and temperature variation. The test chip was fabricated using a 0.13-μm CMOS process, and it occupies an area of 0.059 mm2. The correction cycle is a 14 cycles and the duty-cycle error is below ±1.4%. At an operating frequency of 1 GHz, the power dissipation and peak-to-peak jitter are measured at 5.6 mW and 20.5 ps, respectively.",

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AU - Kim, Soo-Won

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AB - An all-digital duty-cycle corrector with a wide duty correction range and fast correction time is hereby presented. The proposed corrector uses a 1-bit digital duty-cycle detector with a time-to-digital converter, and it achieves a duty correction range between 10% and 90% with a low pressure, volume, and temperature variation. The test chip was fabricated using a 0.13-μm CMOS process, and it occupies an area of 0.059 mm2. The correction cycle is a 14 cycles and the duty-cycle error is below ±1.4%. At an operating frequency of 1 GHz, the power dissipation and peak-to-peak jitter are measured at 5.6 mW and 20.5 ps, respectively.

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All-Digital Duty-Cycle Corrector with a Wide Duty Correction Range for DRAM Applications

Abstract

Keywords

ASJC Scopus subject areas

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