An automated glitch-detection/restoration method of atomic force microscope images

Chankyeong Hyon, Sangwook Oh, Hyungkwon Kim, Sanghoon Sull, Sungwoo Hwang, Doyeol Ahn, Youngju Park, Eunkyu Kim

Research output: Contribution to journalArticle

3 Citations (Scopus)
Original languageEnglish
Number of pages1
JournalReview of Scientific Instruments
Volume73
Issue number9
DOIs
Publication statusPublished - 2002 Sep

ASJC Scopus subject areas

  • Instrumentation

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