An automated glitch-detection/restoration method of atomic force microscope images

Chankyeong Hyon, Sangwook Oh, Hyungkwon Kim, Sanghoon Sull, Sungwoo Hwang, Doyeol Ahn, Youngju Park, Eunkyu Kim

Research output: Contribution to journalArticle

3 Citations (Scopus)
Original languageEnglish
JournalReview of Scientific Instruments
Volume73
Issue number9
DOIs
Publication statusPublished - 2002 Sep 1

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restoration
Restoration
Microscopes
microscopes

ASJC Scopus subject areas

  • Instrumentation
  • Physics and Astronomy (miscellaneous)

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An automated glitch-detection/restoration method of atomic force microscope images. / Hyon, Chankyeong; Oh, Sangwook; Kim, Hyungkwon; Sull, Sanghoon; Hwang, Sungwoo; Ahn, Doyeol; Park, Youngju; Kim, Eunkyu.

In: Review of Scientific Instruments, Vol. 73, No. 9, 01.09.2002.

Research output: Contribution to journalArticle

Hyon, Chankyeong ; Oh, Sangwook ; Kim, Hyungkwon ; Sull, Sanghoon ; Hwang, Sungwoo ; Ahn, Doyeol ; Park, Youngju ; Kim, Eunkyu. / An automated glitch-detection/restoration method of atomic force microscope images. In: Review of Scientific Instruments. 2002 ; Vol. 73, No. 9.
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