An entropy based method for defect prediction in software product lines

Chang Kyun Jeon, Chulhoon Byun, Neung Hoe Kim, Hoh In

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Determining when software testing should begin and the number of resources that may be required in order to find and fix defects are complicated decisions. If we can predict the number of defects for an upcoming software product given the current development team, it will enable us to make better decisions. A majority of reported defects are managed and tracked using a defect life cycle, which tracks a defect throughout its lifetime. The process starts when the defect is found and ends when the resolution is verified and the defect is closed. Defects transition through different states according to the evolution of the project, which involves testing, debugging, verification. In paper, we presents defect prediction model for consecutive software products that is based on entropy.

Original languageEnglish
Pages (from-to)375-377
Number of pages3
JournalInternational Journal of Multimedia and Ubiquitous Engineering
Volume9
Issue number3
DOIs
Publication statusPublished - 2014 Jan 1

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Entropy
Defects
Software testing
Life cycle
Testing

Keywords

  • Defect life cycle
  • Defect prediction
  • Entropy
  • Product line engineering
  • Software engineering

ASJC Scopus subject areas

  • Computer Science(all)

Cite this

An entropy based method for defect prediction in software product lines. / Jeon, Chang Kyun; Byun, Chulhoon; Kim, Neung Hoe; In, Hoh.

In: International Journal of Multimedia and Ubiquitous Engineering, Vol. 9, No. 3, 01.01.2014, p. 375-377.

Research output: Contribution to journalArticle

Jeon, Chang Kyun ; Byun, Chulhoon ; Kim, Neung Hoe ; In, Hoh. / An entropy based method for defect prediction in software product lines. In: International Journal of Multimedia and Ubiquitous Engineering. 2014 ; Vol. 9, No. 3. pp. 375-377.
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