Analysis of Defects on Chemically-Treated CdZnTe Surfaces

A. Hossain, A. E. Bolotnikov, G. S. Camarda, Y. Cui, R. Gul, Kihyun Kim, U. N. Roy, X. Tong, G. Yang, R. B. James

Research output: Contribution to journalArticle

Abstract

In this work, we focused on investigating the various defects that extend into the near-surface region of CdZnTe (CZT) crystals, and on exploring processing techniques for producing a smooth, non-conductive surface that is ideal for growing thin films and depositing contacts. We determined the surface’s features and the chemical species present using atomic-force microscopy, x-ray photoelectron spectroscopy, and scanning electron microscopy (SEM), coupled with energy-dispersive spectroscopy. We revealed crystallographic defects, e.g., sub-grains and dislocations on the CZT crystals’ surfaces, after employing selected chemical etchants, and then characterized them using optical microscopy, SEM and optical profilometer. Our experimental data imply that the surface defects and chemical species induced by chemical processing may alter the material’s interfacial behavior, and ultimately significantly influence the performance of radiation detectors.

Original languageEnglish
Pages (from-to)3018-3022
Number of pages5
JournalJournal of Electronic Materials
Volume44
Issue number9
DOIs
Publication statusPublished - 2015 Sep 26

Fingerprint

Defects
defects
profilometers
scanning electron microscopy
etchants
radiation detectors
surface defects
crystal surfaces
Radiation detectors
x ray spectroscopy
Crystals
Scanning electron microscopy
Surface defects
Photoelectron spectroscopy
Processing
Dislocations (crystals)
photoelectron spectroscopy
atomic force microscopy
microscopy
Optical microscopy

Keywords

  • CdZnTe
  • chemo-mechanical polishing
  • dislocations
  • metal–semiconductor interface
  • substrate and radiation detector

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Cite this

Hossain, A., Bolotnikov, A. E., Camarda, G. S., Cui, Y., Gul, R., Kim, K., ... James, R. B. (2015). Analysis of Defects on Chemically-Treated CdZnTe Surfaces. Journal of Electronic Materials, 44(9), 3018-3022. https://doi.org/10.1007/s11664-015-3742-4

Analysis of Defects on Chemically-Treated CdZnTe Surfaces. / Hossain, A.; Bolotnikov, A. E.; Camarda, G. S.; Cui, Y.; Gul, R.; Kim, Kihyun; Roy, U. N.; Tong, X.; Yang, G.; James, R. B.

In: Journal of Electronic Materials, Vol. 44, No. 9, 26.09.2015, p. 3018-3022.

Research output: Contribution to journalArticle

Hossain, A, Bolotnikov, AE, Camarda, GS, Cui, Y, Gul, R, Kim, K, Roy, UN, Tong, X, Yang, G & James, RB 2015, 'Analysis of Defects on Chemically-Treated CdZnTe Surfaces', Journal of Electronic Materials, vol. 44, no. 9, pp. 3018-3022. https://doi.org/10.1007/s11664-015-3742-4
Hossain A, Bolotnikov AE, Camarda GS, Cui Y, Gul R, Kim K et al. Analysis of Defects on Chemically-Treated CdZnTe Surfaces. Journal of Electronic Materials. 2015 Sep 26;44(9):3018-3022. https://doi.org/10.1007/s11664-015-3742-4
Hossain, A. ; Bolotnikov, A. E. ; Camarda, G. S. ; Cui, Y. ; Gul, R. ; Kim, Kihyun ; Roy, U. N. ; Tong, X. ; Yang, G. ; James, R. B. / Analysis of Defects on Chemically-Treated CdZnTe Surfaces. In: Journal of Electronic Materials. 2015 ; Vol. 44, No. 9. pp. 3018-3022.
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