Analysis of lattice temperature in super junction trench gate power MOSFET as changing degree of trench etching

Byeong Il Lee, Jong Min Geum, Eun Sik Jung, Ey Goo Kang, Yong Tae Kim, Man Young Sung

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Super junction trench gate power MOSFETs have been receiving attention in terms of the trade-off between breakdown voltage and on-resistance [1]. The vertical structure of super junction trench gate power MOSFETs allows the on-resistance to be reduced compared with conventional Trench Gate Power MOSFETs. The heat release of devices is also decreased with the reduction of on-resistance. In this paper, Lattice Temperature of two devices, Trench Gate Power MOSFET and Super junction trench gate power MOSFET, are compared in several temperature circumstance with the same Breakdown Voltage and Cell-pitch. The devices were designed by 100V Breakdown voltage and measured from 250K Lattice Temperature. We have tried to investigate how much temperature rise in the same condition. According as temperature gap between top of devices and bottom of devices, Super junction trench gate power MOSFET has a tendency to generate lower heat release than Trench Gate Power MOSFET. This means that Super junction trench gate power MOSFET is superior for wide-temperature range operation. When trench etching process is applied for making P-pillar region, trench angle factor is also important component. Depending on trench angle, characteristics of Super junction device are changed. In this paper, we focus temperature characteristic as changing trench angle factor. Consequently, Trench angle factor don't have a great effect on temperature change.

Original languageEnglish
Pages (from-to)263-267
Number of pages5
JournalJournal of Semiconductor Technology and Science
Volume14
Issue number3
DOIs
Publication statusPublished - 2014 Jan 1

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Etching
Electric breakdown
Temperature
Power MOSFET

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Analysis of lattice temperature in super junction trench gate power MOSFET as changing degree of trench etching. / Lee, Byeong Il; Geum, Jong Min; Jung, Eun Sik; Kang, Ey Goo; Kim, Yong Tae; Sung, Man Young.

In: Journal of Semiconductor Technology and Science, Vol. 14, No. 3, 01.01.2014, p. 263-267.

Research output: Contribution to journalArticle

Lee, Byeong Il ; Geum, Jong Min ; Jung, Eun Sik ; Kang, Ey Goo ; Kim, Yong Tae ; Sung, Man Young. / Analysis of lattice temperature in super junction trench gate power MOSFET as changing degree of trench etching. In: Journal of Semiconductor Technology and Science. 2014 ; Vol. 14, No. 3. pp. 263-267.
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