Analysis of patterned defects on graphene using micro-Raman spectroscopy and liquid crystals

Gwangseok Yang, Sooyeoun Oh, Ji Hyun Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this work, we report a facile probing method for large-area graphene. Patterned defects in graphene were defined by means of photolithography and oxygen plasma treatment. Defect level was characterized using micro-Raman spectroscopy. Only defined region was exposed to oxygen plasma while almost no change is observed in PR remained region. The patterned defects in graphene were visualized using polarized optical microscopy with nematic liquid crystal. Differently aligned textures of liquid crystal result in distinct optical variations.

Original languageEnglish
Title of host publicationECS Transactions
PublisherElectrochemical Society Inc.
Pages281-284
Number of pages4
Volume66
Edition1
ISBN (Print)9781607685395
DOIs
Publication statusPublished - 2015
EventSymposium on Wide Bandgap Semiconductor Materials and Devices 16 - 227th ECS Meeting - Chicago, United States
Duration: 2015 May 242015 May 28

Other

OtherSymposium on Wide Bandgap Semiconductor Materials and Devices 16 - 227th ECS Meeting
CountryUnited States
CityChicago
Period15/5/2415/5/28

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Yang, G., Oh, S., & Kim, J. H. (2015). Analysis of patterned defects on graphene using micro-Raman spectroscopy and liquid crystals. In ECS Transactions (1 ed., Vol. 66, pp. 281-284). Electrochemical Society Inc.. https://doi.org/10.1149/06601.0281ecst