Analysis of thermal stress effect on blue phosphorescent organic light-emitting diodes for device stability

Sungkyu Lee, Ho Won Lee, In Yeob Na, Han Kyu Yoo, Kyo Min Hwang, Hyun Jung Baek, Gyu-Tae Kim, Young Kwan Kim

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

We demonstrated the influence of external thermal stress on blue phosphorescent organic lightemitting diodes. We fabricated devices using the same structure and materials, including a low glass transition temperature material, and the devices were then annealed at 50, 60, 70, and 80 °C to compare their properties to those of pristine device. In this study, we observed a decrease in the current density-voltage-luminance and lifetime due to thermal stress, and we also used various analysis methods, such as impedance spectroscopy, to obtain detailed measurements to determine the degradation mechanisms of the device.

Original languageEnglish
Pages (from-to)14-19
Number of pages6
JournalNanoscience and Nanotechnology Letters
Volume9
Issue number1
DOIs
Publication statusPublished - 2017 Jan 1

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Organic light emitting diodes (OLED)
Thermal stress
Luminance
Diodes
Current density
Spectroscopy
Degradation
Electric potential
Glass transition temperature

Keywords

  • Blue phosphorescent organic light-emitting diode
  • Crystallization
  • Degradation
  • Orinterdiffusion
  • Thermal stress

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Analysis of thermal stress effect on blue phosphorescent organic light-emitting diodes for device stability. / Lee, Sungkyu; Lee, Ho Won; Na, In Yeob; Yoo, Han Kyu; Hwang, Kyo Min; Baek, Hyun Jung; Kim, Gyu-Tae; Kim, Young Kwan.

In: Nanoscience and Nanotechnology Letters, Vol. 9, No. 1, 01.01.2017, p. 14-19.

Research output: Contribution to journalArticle

Lee, Sungkyu ; Lee, Ho Won ; Na, In Yeob ; Yoo, Han Kyu ; Hwang, Kyo Min ; Baek, Hyun Jung ; Kim, Gyu-Tae ; Kim, Young Kwan. / Analysis of thermal stress effect on blue phosphorescent organic light-emitting diodes for device stability. In: Nanoscience and Nanotechnology Letters. 2017 ; Vol. 9, No. 1. pp. 14-19.
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