Anomalous resonant frequency changes in piezoelectric microcantilevers by monolayer formation of Au films

Jeong Hoon Lee, Kyo Seon Hwang, Dae Sung Yoon, Hyungsuk Kim, Seung Ho Song, Ji Yoon Kang, Tae Song Kim

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Although the resonant frequency of a microcantilever has been reported to be changed by surface stress and/or flexural rigidity, the reasons still remained unclear. Here, we present an observation of anomalous resonant frequency change with positive values at 3.25 Å thickness of Au, where it represents the monolayer formation of Au films. This result illustrates the surface stress-dependence of the resonant frequency. The thickness at where the resonant frequency shift would become zero through the compensation of the mass, and the surface stress is expected to be approximately three monolayers (9.7 Å).

Original languageEnglish
Article number143701
JournalApplied Physics Letters
Volume99
Issue number14
DOIs
Publication statusPublished - 2011 Oct 3
Externally publishedYes

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resonant frequencies
rigidity
frequency shift

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Anomalous resonant frequency changes in piezoelectric microcantilevers by monolayer formation of Au films. / Lee, Jeong Hoon; Hwang, Kyo Seon; Yoon, Dae Sung; Kim, Hyungsuk; Song, Seung Ho; Kang, Ji Yoon; Kim, Tae Song.

In: Applied Physics Letters, Vol. 99, No. 14, 143701, 03.10.2011.

Research output: Contribution to journalArticle

Lee, Jeong Hoon ; Hwang, Kyo Seon ; Yoon, Dae Sung ; Kim, Hyungsuk ; Song, Seung Ho ; Kang, Ji Yoon ; Kim, Tae Song. / Anomalous resonant frequency changes in piezoelectric microcantilevers by monolayer formation of Au films. In: Applied Physics Letters. 2011 ; Vol. 99, No. 14.
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