Anomalous resonant frequency changes in piezoelectric microcantilevers by monolayer formation of Au films

Jeong Hoon Lee; Kyo Seon Hwang; Dae Sung Yoon; Hyungsuk Kim; Seung Ho Song; Ji Yoon Kang; Tae Song Kim

doi:10.1063/1.3621825

Anomalous resonant frequency changes in piezoelectric microcantilevers by monolayer formation of Au films

Jeong Hoon Lee, Kyo Seon Hwang, Dae Sung Yoon, Hyungsuk Kim, Seung Ho Song, Ji Yoon Kang, Tae Song Kim

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

Although the resonant frequency of a microcantilever has been reported to be changed by surface stress and/or flexural rigidity, the reasons still remained unclear. Here, we present an observation of anomalous resonant frequency change with positive values at 3.25 Å thickness of Au, where it represents the monolayer formation of Au films. This result illustrates the surface stress-dependence of the resonant frequency. The thickness at where the resonant frequency shift would become zero through the compensation of the mass, and the surface stress is expected to be approximately three monolayers (9.7 Å).

Original language	English
Article number	143701
Journal	Applied Physics Letters
Volume	99
Issue number	14
DOIs	https://doi.org/10.1063/1.3621825
Publication status	Published - 2011 Oct 3
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Anomalous resonant frequency changes in piezoelectric microcantilevers by monolayer formation of Au films",

abstract = "Although the resonant frequency of a microcantilever has been reported to be changed by surface stress and/or flexural rigidity, the reasons still remained unclear. Here, we present an observation of anomalous resonant frequency change with positive values at 3.25 {\AA} thickness of Au, where it represents the monolayer formation of Au films. This result illustrates the surface stress-dependence of the resonant frequency. The thickness at where the resonant frequency shift would become zero through the compensation of the mass, and the surface stress is expected to be approximately three monolayers (9.7 {\AA}).",

author = "Lee, {Jeong Hoon} and Hwang, {Kyo Seon} and Yoon, {Dae Sung} and Hyungsuk Kim and Song, {Seung Ho} and Kang, {Ji Yoon} and Kim, {Tae Song}",

note = "Funding Information: J. H. Lee and K. S. Hwang contributed to the work equally. We are very grateful for the financial support from the KIST institutional program and the Dual Use Technology Center sponsored by the Ministry of Knowledge Economy and Defense Acquisition Program Administration. J. H. Lee is also supported by a Research Grant from Kwangwoon University in 2011.",

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doi = "10.1063/1.3621825",

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T1 - Anomalous resonant frequency changes in piezoelectric microcantilevers by monolayer formation of Au films

AU - Lee, Jeong Hoon

AU - Hwang, Kyo Seon

AU - Yoon, Dae Sung

AU - Kim, Hyungsuk

AU - Song, Seung Ho

AU - Kang, Ji Yoon

AU - Kim, Tae Song

N1 - Funding Information: J. H. Lee and K. S. Hwang contributed to the work equally. We are very grateful for the financial support from the KIST institutional program and the Dual Use Technology Center sponsored by the Ministry of Knowledge Economy and Defense Acquisition Program Administration. J. H. Lee is also supported by a Research Grant from Kwangwoon University in 2011.

PY - 2011/10/3

Y1 - 2011/10/3

N2 - Although the resonant frequency of a microcantilever has been reported to be changed by surface stress and/or flexural rigidity, the reasons still remained unclear. Here, we present an observation of anomalous resonant frequency change with positive values at 3.25 Å thickness of Au, where it represents the monolayer formation of Au films. This result illustrates the surface stress-dependence of the resonant frequency. The thickness at where the resonant frequency shift would become zero through the compensation of the mass, and the surface stress is expected to be approximately three monolayers (9.7 Å).

AB - Although the resonant frequency of a microcantilever has been reported to be changed by surface stress and/or flexural rigidity, the reasons still remained unclear. Here, we present an observation of anomalous resonant frequency change with positive values at 3.25 Å thickness of Au, where it represents the monolayer formation of Au films. This result illustrates the surface stress-dependence of the resonant frequency. The thickness at where the resonant frequency shift would become zero through the compensation of the mass, and the surface stress is expected to be approximately three monolayers (9.7 Å).

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U2 - 10.1063/1.3621825

DO - 10.1063/1.3621825

M3 - Article

AN - SCOPUS:80053984646

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VL - 99

JO - Applied Physics Letters

JF - Applied Physics Letters

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ER -

Anomalous resonant frequency changes in piezoelectric microcantilevers by monolayer formation of Au films

Abstract

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