apparatus and metho of measuring the surfact atate for analyzing colour and the shape in three dimension

Chil Hwan Oh (Inventor)

Research output: Patent

Abstract

입체적 형태 및 색체 분석을 위한 표면상태 측정 장치 및 그 방법
Original languageEnglish
Patent number10-0286434
Publication statusPublished - 2001 Jan 13

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