Application of a handheld X-ray fluorescence spectrometer for real-time, high-density quantitative analysis of drilled igneous rocks and sediments during IODP Expedition 352

J. G. Ryan, J. W. Shervais, Y. Li, M. K. Reagan, H. Y. Li, D. Heaton, M. Godard, M. Kirchenbaur, S. A. Whattam, J. A. Pearce, T. Chapman, W. Nelson, J. Prytulak, K. Shimizu, K. Petronotis

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