Automated artefact elimination in computed tomography: A preliminary report for traumatic brain injury and stroke

Dae Hyeon Park, Hakseung Kim, Young Tak Kim, Xiao Ke Yang, Hack Jin Lee, Eun Jin Jeong, Dong Ju Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Traumatic brain injury (TBI) and stroke are the two major form of Acquired brain injury (ABI). To the effectiveness of the quantitative CT analysis in ABI, fully automated artefact elimination technique would be required. So, this study purpose to test the effectiveness of proposed algorithm against CT images from TBI and stroke patients. For the effectiveness of automated artefact elimination algorithm, CT images from stroke and TBI subjects were used, 522 and 240 respectively. As a result, the algorithm showed 100% success rate in eliminating artefacts by using 'fracture-sealing' algorithm. This algorithm was able to eliminate artefacts in CT image with acceptable failure rate. The fracture-sealing algorithm by utilizing pseudo-object pixels can be also useful for designating ROI, and for the automated artifact elimination.

Original languageEnglish
Title of host publication3rd International Winter Conference on Brain-Computer Interface, BCI 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479974948
DOIs
Publication statusPublished - 2015 Mar 30
Event2015 3rd International Winter Conference on Brain-Computer Interface, BCI 2015 - Gangwon-Do, Korea, Republic of
Duration: 2015 Jan 122015 Jan 14

Other

Other2015 3rd International Winter Conference on Brain-Computer Interface, BCI 2015
CountryKorea, Republic of
CityGangwon-Do
Period15/1/1215/1/14

Fingerprint

Artifacts
Tomography
Brain
Stroke
Brain Injuries
Traumatic Brain Injury
Pixels

Keywords

  • Artefact Removing Algorithm
  • Computed tomography
  • Quntitatve CT analysis
  • Stroke
  • Traumatic brain injury

ASJC Scopus subject areas

  • Human-Computer Interaction
  • Cognitive Neuroscience
  • Sensory Systems

Cite this

Park, D. H., Kim, H., Kim, Y. T., Ke Yang, X., Lee, H. J., Jeong, E. J., & Kim, D. J. (2015). Automated artefact elimination in computed tomography: A preliminary report for traumatic brain injury and stroke. In 3rd International Winter Conference on Brain-Computer Interface, BCI 2015 [7073038] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IWW-BCI.2015.7073038

Automated artefact elimination in computed tomography : A preliminary report for traumatic brain injury and stroke. / Park, Dae Hyeon; Kim, Hakseung; Kim, Young Tak; Ke Yang, Xiao; Lee, Hack Jin; Jeong, Eun Jin; Kim, Dong Ju.

3rd International Winter Conference on Brain-Computer Interface, BCI 2015. Institute of Electrical and Electronics Engineers Inc., 2015. 7073038.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Park, DH, Kim, H, Kim, YT, Ke Yang, X, Lee, HJ, Jeong, EJ & Kim, DJ 2015, Automated artefact elimination in computed tomography: A preliminary report for traumatic brain injury and stroke. in 3rd International Winter Conference on Brain-Computer Interface, BCI 2015., 7073038, Institute of Electrical and Electronics Engineers Inc., 2015 3rd International Winter Conference on Brain-Computer Interface, BCI 2015, Gangwon-Do, Korea, Republic of, 15/1/12. https://doi.org/10.1109/IWW-BCI.2015.7073038
Park DH, Kim H, Kim YT, Ke Yang X, Lee HJ, Jeong EJ et al. Automated artefact elimination in computed tomography: A preliminary report for traumatic brain injury and stroke. In 3rd International Winter Conference on Brain-Computer Interface, BCI 2015. Institute of Electrical and Electronics Engineers Inc. 2015. 7073038 https://doi.org/10.1109/IWW-BCI.2015.7073038
Park, Dae Hyeon ; Kim, Hakseung ; Kim, Young Tak ; Ke Yang, Xiao ; Lee, Hack Jin ; Jeong, Eun Jin ; Kim, Dong Ju. / Automated artefact elimination in computed tomography : A preliminary report for traumatic brain injury and stroke. 3rd International Winter Conference on Brain-Computer Interface, BCI 2015. Institute of Electrical and Electronics Engineers Inc., 2015.
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