Bias offset correction technique for uncooled infrared bolometer sensor readout IC

Won Park Sang, Joon Hwang Sang, Woo Ryu Jang, Woo Hong Seung, Man Young Sung

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Infrared bolometer sensor's variation is detected by voltage drop between a reference resistor and a bolometer resistor in this architecture. One of the serious problems in this architecture is that these resistors value has a process variation. So common-mode level could be different from expectation value in room temperature. Different common-mode level could lead to wrong output at the end of readout circuit. We suggest useful method to solve this problem. Difference correction using capacitor has reduced CM level difference to 88.5 % for 1 MΩ bolometer and reference resistor's 10 % variation.

Original languageEnglish
Title of host publication2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
Pages725-728
Number of pages4
DOIs
Publication statusPublished - 2006 Dec 1
Event2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC - Howloon, Hong Kong
Duration: 2005 Dec 192005 Dec 21

Other

Other2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC
CountryHong Kong
CityHowloon
Period05/12/1905/12/21

Fingerprint

Bolometers
Resistors
Infrared radiation
Sensors
Capacitors
Networks (circuits)
Temperature

Keywords

  • Bolometer
  • Common-mode voltage
  • Offset
  • Readout IC

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Sang, W. P., Sang, J. H., Jang, W. R., Seung, W. H., & Sung, M. Y. (2006). Bias offset correction technique for uncooled infrared bolometer sensor readout IC. In 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC (pp. 725-728). [1635378] https://doi.org/10.1109/EDSSC.2005.1635378

Bias offset correction technique for uncooled infrared bolometer sensor readout IC. / Sang, Won Park; Sang, Joon Hwang; Jang, Woo Ryu; Seung, Woo Hong; Sung, Man Young.

2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC. 2006. p. 725-728 1635378.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sang, WP, Sang, JH, Jang, WR, Seung, WH & Sung, MY 2006, Bias offset correction technique for uncooled infrared bolometer sensor readout IC. in 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC., 1635378, pp. 725-728, 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC, Howloon, Hong Kong, 05/12/19. https://doi.org/10.1109/EDSSC.2005.1635378
Sang WP, Sang JH, Jang WR, Seung WH, Sung MY. Bias offset correction technique for uncooled infrared bolometer sensor readout IC. In 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC. 2006. p. 725-728. 1635378 https://doi.org/10.1109/EDSSC.2005.1635378
Sang, Won Park ; Sang, Joon Hwang ; Jang, Woo Ryu ; Seung, Woo Hong ; Sung, Man Young. / Bias offset correction technique for uncooled infrared bolometer sensor readout IC. 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC. 2006. pp. 725-728
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