Bipolar Log-Intensity-Variance Histogram Method for Local Image Patch Intensity Change Measurements

Han Wang; Quan Shi; Zhihuo Xu; Ming Wei; Hanseok Ko

doi:10.1155/2019/3651529

Bipolar Log-Intensity-Variance Histogram Method for Local Image Patch Intensity Change Measurements

Han Wang, Quan Shi, Zhihuo Xu, Ming Wei, Hanseok Ko

School of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

For a fixed-position camera, the intensity changes of an image pixel are often caused by object movement or illumination change. This paper focuses on such a problem: given two adjacent local image patches, how can the causes of intensity change be determined? A bipolar log-intensity-variance histogram is proposed to describe the intensity variations on the chaos phase plot subspace. This is combined with two sigmoid functions to construct a probabilistic measure function. Experimental results show that the proposed measurements are more effective and robust than conventional methods to the cause of variation in image intensity.

Original language	English
Article number	3651529
Journal	Mathematical Problems in Engineering
Volume	2019
DOIs	https://doi.org/10.1155/2019/3651529
Publication status	Published - 2019

ASJC Scopus subject areas

Mathematics(all)
Engineering(all)

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title = "Bipolar Log-Intensity-Variance Histogram Method for Local Image Patch Intensity Change Measurements",

abstract = "For a fixed-position camera, the intensity changes of an image pixel are often caused by object movement or illumination change. This paper focuses on such a problem: given two adjacent local image patches, how can the causes of intensity change be determined? A bipolar log-intensity-variance histogram is proposed to describe the intensity variations on the chaos phase plot subspace. This is combined with two sigmoid functions to construct a probabilistic measure function. Experimental results show that the proposed measurements are more effective and robust than conventional methods to the cause of variation in image intensity.",

author = "Han Wang and Quan Shi and Zhihuo Xu and Ming Wei and Hanseok Ko",

note = "Funding Information: This work was supported by the Natural Science Foundation of China under grants 61872425, 61771265, and 61801247; the University Science Research of Jiangsu Province Foundation under grant 17KJB520029; the Natural Science Foundation of Jiangsu Province of China under grant BK20180945; Nantong University (17R31); the “333” Talents of Jiangsu (BRA2017475); the Science and Technology Project of Nan-tong (GY12017006); and the Basic Science Research Program of NRF (NRF-2017R1A2B4012720). Publisher Copyright: {\textcopyright} 2019 Han Wang et al.",

year = "2019",

doi = "10.1155/2019/3651529",

language = "English",

volume = "2019",

journal = "Mathematical Problems in Engineering",

issn = "1024-123X",

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T1 - Bipolar Log-Intensity-Variance Histogram Method for Local Image Patch Intensity Change Measurements

AU - Wang, Han

AU - Shi, Quan

AU - Xu, Zhihuo

AU - Wei, Ming

AU - Ko, Hanseok

N1 - Funding Information: This work was supported by the Natural Science Foundation of China under grants 61872425, 61771265, and 61801247; the University Science Research of Jiangsu Province Foundation under grant 17KJB520029; the Natural Science Foundation of Jiangsu Province of China under grant BK20180945; Nantong University (17R31); the “333” Talents of Jiangsu (BRA2017475); the Science and Technology Project of Nan-tong (GY12017006); and the Basic Science Research Program of NRF (NRF-2017R1A2B4012720). Publisher Copyright: © 2019 Han Wang et al.

PY - 2019

Y1 - 2019

N2 - For a fixed-position camera, the intensity changes of an image pixel are often caused by object movement or illumination change. This paper focuses on such a problem: given two adjacent local image patches, how can the causes of intensity change be determined? A bipolar log-intensity-variance histogram is proposed to describe the intensity variations on the chaos phase plot subspace. This is combined with two sigmoid functions to construct a probabilistic measure function. Experimental results show that the proposed measurements are more effective and robust than conventional methods to the cause of variation in image intensity.

AB - For a fixed-position camera, the intensity changes of an image pixel are often caused by object movement or illumination change. This paper focuses on such a problem: given two adjacent local image patches, how can the causes of intensity change be determined? A bipolar log-intensity-variance histogram is proposed to describe the intensity variations on the chaos phase plot subspace. This is combined with two sigmoid functions to construct a probabilistic measure function. Experimental results show that the proposed measurements are more effective and robust than conventional methods to the cause of variation in image intensity.

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Bipolar Log-Intensity-Variance Histogram Method for Local Image Patch Intensity Change Measurements

Abstract

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