Abstract
For a fixed-position camera, the intensity changes of an image pixel are often caused by object movement or illumination change. This paper focuses on such a problem: given two adjacent local image patches, how can the causes of intensity change be determined? A bipolar log-intensity-variance histogram is proposed to describe the intensity variations on the chaos phase plot subspace. This is combined with two sigmoid functions to construct a probabilistic measure function. Experimental results show that the proposed measurements are more effective and robust than conventional methods to the cause of variation in image intensity.
| Original language | English |
|---|---|
| Article number | 3651529 |
| Journal | Mathematical Problems in Engineering |
| Volume | 2019 |
| DOIs | |
| Publication status | Published - 2019 Jan 1 |
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ASJC Scopus subject areas
- Mathematics(all)
- Engineering(all)
Cite this
Bipolar Log-Intensity-Variance Histogram Method for Local Image Patch Intensity Change Measurements. / Wang, Han; Shi, Quan; Xu, Zhihuo; Wei, Ming; Ko, Hanseok.
In: Mathematical Problems in Engineering, Vol. 2019, 3651529, 01.01.2019.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Bipolar Log-Intensity-Variance Histogram Method for Local Image Patch Intensity Change Measurements
AU - Wang, Han
AU - Shi, Quan
AU - Xu, Zhihuo
AU - Wei, Ming
AU - Ko, Hanseok
PY - 2019/1/1
Y1 - 2019/1/1
N2 - For a fixed-position camera, the intensity changes of an image pixel are often caused by object movement or illumination change. This paper focuses on such a problem: given two adjacent local image patches, how can the causes of intensity change be determined? A bipolar log-intensity-variance histogram is proposed to describe the intensity variations on the chaos phase plot subspace. This is combined with two sigmoid functions to construct a probabilistic measure function. Experimental results show that the proposed measurements are more effective and robust than conventional methods to the cause of variation in image intensity.
AB - For a fixed-position camera, the intensity changes of an image pixel are often caused by object movement or illumination change. This paper focuses on such a problem: given two adjacent local image patches, how can the causes of intensity change be determined? A bipolar log-intensity-variance histogram is proposed to describe the intensity variations on the chaos phase plot subspace. This is combined with two sigmoid functions to construct a probabilistic measure function. Experimental results show that the proposed measurements are more effective and robust than conventional methods to the cause of variation in image intensity.
UR - http://www.scopus.com/inward/record.url?scp=85067811560&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85067811560&partnerID=8YFLogxK
U2 - 10.1155/2019/3651529
DO - 10.1155/2019/3651529
M3 - Article
AN - SCOPUS:85067811560
VL - 2019
JO - Mathematical Problems in Engineering
JF - Mathematical Problems in Engineering
SN - 1024-123X
M1 - 3651529
ER -