Blind watermarking for authentication of 3-D QSplat models

Sang Uk Park, Young Yoon Lee, Chang-Su Kim, Sang Uk Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we propose a new scheme for blind watermarking of three-dimensional (3-D) point clouds in the QSplat representation. The proposed watermarking algorithm can support the authentication, the proof of ownership, and the copyright protection of 3-D data. We apply the quantization index modulation (QIM) to QSplat position data, such that the quantization indices of points are mapped to either even or odd set according to the watermark. The same watermark is repeatedly embedded into a cluster of the 3-D model at a low resolution to guarantee the robustness of the watermark. At the decoder, the watermark is extracted in a blind manner without requiring the original model. Experimental results show that the proposed watermarking algorithm is robust against numerous attacks, including additive random noises, translation, cropping, simplification and their combinations.

Original languageEnglish
Title of host publicationMultimedia Systems and Applications IX
DOIs
Publication statusPublished - 2006
EventMultimedia Systems and Applications IX - Boston, MA, United States
Duration: 2006 Oct 22006 Oct 3

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6391
ISSN (Print)0277-786X

Other

OtherMultimedia Systems and Applications IX
CountryUnited States
CityBoston, MA
Period06/10/206/10/3

Keywords

  • 3-D watermarking
  • Blind watermarking
  • Point clouds
  • QIM

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Park, S. U., Lee, Y. Y., Kim, C-S., & Lee, S. U. (2006). Blind watermarking for authentication of 3-D QSplat models. In Multimedia Systems and Applications IX [639111] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6391). https://doi.org/10.1117/12.685811