Boolean functions over nano-fabrics

Improving resilience through coding

Sang Hyun Lee, Sriram Vishwanath

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

This paper determines mechanisms to mitigate errors when implementing Boolean functions in nano-circuits. Nano-fabrics are expected to have high defect rates as atomic variations directly impact such materials. This paper develops a coding mechanism that uses a combination of cheap, but unreliable nano-device as the main function and reliable, but expensive CMOS devices to implement the coding mechanism. The unique feature of this paper is that it exploits the don't-cares that naturally occur in Boolean functions to construct better codes. The reliable Boolean function problem is cast as a constraint satisfaction problem and then solved using a tree-based dynamic programming algorithm. (Here, the word "dynamic programming" is used in the same sense as computer-science literature, i.e., and as an efficient search algorithm over trees.)

Original languageEnglish
Article number6042351
Pages (from-to)2054-2065
Number of pages12
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume20
Issue number11
DOIs
Publication statusPublished - 2012 Jan 1
Externally publishedYes

Fingerprint

Boolean functions
Dynamic programming
Constraint satisfaction problems
Trees (mathematics)
Computer science
Defects
Networks (circuits)

Keywords

  • Cyclic codes
  • don't-care (DC) substitution
  • error correction
  • nano-fabrics

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Boolean functions over nano-fabrics : Improving resilience through coding. / Lee, Sang Hyun; Vishwanath, Sriram.

In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 20, No. 11, 6042351, 01.01.2012, p. 2054-2065.

Research output: Contribution to journalArticle

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