TY - GEN
T1 - Boolean functions over nano-fabrics
T2 - IEEE Information Theory Workshop 2010, ITW 2010
AU - Lee, Sang Hyun
AU - Vishwanath, Sriram
PY - 2010
Y1 - 2010
N2 - This paper determines mechanisms to tackle errors when implementing Boolean functions in nano-circuits. Nanofabrics are expected to have very high defect rates as atomic variations directly impact such materials. This paper develops a coding mechanism that uses a combination of cheap but unreliable nano-device as the main function and reliable but expensive CMOS devices to implement the coding mechanism. The unique feature of this paper is that it exploits the don't-cares that naturally occur in Boolean functions to construct better codes. The reliable Boolean function problem is cast as a constraint satisfaction problem and then solved using a tree-based dynamic programming algorithm.
AB - This paper determines mechanisms to tackle errors when implementing Boolean functions in nano-circuits. Nanofabrics are expected to have very high defect rates as atomic variations directly impact such materials. This paper develops a coding mechanism that uses a combination of cheap but unreliable nano-device as the main function and reliable but expensive CMOS devices to implement the coding mechanism. The unique feature of this paper is that it exploits the don't-cares that naturally occur in Boolean functions to construct better codes. The reliable Boolean function problem is cast as a constraint satisfaction problem and then solved using a tree-based dynamic programming algorithm.
UR - http://www.scopus.com/inward/record.url?scp=77954829310&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77954829310&partnerID=8YFLogxK
U2 - 10.1109/ITWKSPS.2010.5503134
DO - 10.1109/ITWKSPS.2010.5503134
M3 - Conference contribution
AN - SCOPUS:77954829310
SN - 9781424463725
T3 - IEEE Information Theory Workshop 2010, ITW 2010
BT - IEEE Information Theory Workshop 2010, ITW 2010
Y2 - 6 January 2010 through 8 January 2010
ER -