Abstract
Process monitoring and diagnosis have been widely recognized as important and critical tools in system monitoring for detection of abnormal behavior and quality improvement. In this study, we present bootstrap-based multivariate control charts to efficiently monitor TFT-LCD (Thin Film Transistor Liquid Crystal Display) manufacturing processes containing a number of quality characteristics that are correlated with each other. Experimental results with real data from the TFT-LCD manufacturing process demonstrate the effectiveness and robustness of the bootstrap-based multivariate control charts.
| Original language | English |
|---|---|
| Pages (from-to) | 579-583 |
| Number of pages | 5 |
| Journal | Advanced Science Letters |
| Volume | 13 |
| DOIs | |
| Publication status | Published - 2012 Jun |
Keywords
- Bootstrapping
- Hotelling's T control chart
- Multivariate processes
- Statistical process control
- TFT-LCD Manufacturing process
ASJC Scopus subject areas
- Computer Science(all)
- Health(social science)
- Mathematics(all)
- Education
- Environmental Science(all)
- Engineering(all)
- Energy(all)