Bootstrap-based multivariate control charts in Thin Film Transistor Liquid Crystal Display manufacturing processes

Ji Hoon Kang, Kyu Jong Lee, Jung Hwan Son, Seog Sang Hyun, Hyoung Kyoon Kim, Gi Don Hwang, Seoung Bum Kim

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Process monitoring and diagnosis have been widely recognized as important and critical tools in system monitoring for detection of abnormal behavior and quality improvement. In this study, we present bootstrap-based multivariate control charts to efficiently monitor TFT-LCD (Thin Film Transistor Liquid Crystal Display) manufacturing processes containing a number of quality characteristics that are correlated with each other. Experimental results with real data from the TFT-LCD manufacturing process demonstrate the effectiveness and robustness of the bootstrap-based multivariate control charts.

Original languageEnglish
Pages (from-to)579-583
Number of pages5
JournalAdvanced Science Letters
Volume13
DOIs
Publication statusPublished - 2012 Jun

Keywords

  • Bootstrapping
  • Hotelling's T control chart
  • Multivariate processes
  • Statistical process control
  • TFT-LCD Manufacturing process

ASJC Scopus subject areas

  • Computer Science(all)
  • Health(social science)
  • Mathematics(all)
  • Education
  • Environmental Science(all)
  • Engineering(all)
  • Energy(all)

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